Memory and Compute-in-Memory Based on Ferroelectric Field Effect Transistors

LIU Yong,LI Taixin,ZHU Xi,YANG Huazhong,LI Xueqing
DOI: https://doi.org/10.11999/JEIT230370
2023-01-01
Abstract:Recently, with the development of the Internet of Things and Artificial Intelligence, higher energy efficiency, density, and performance in on-chip memories and intelligent computing are required. Facing the energy efficiency and density bottleneck in conventional CMOS memories and the “memory wall” problem in the von Neumann architecture, emerging NonVolatile Memories (NVMs) such as Ferroelectric Field Effect Transistors (FeFETs) bring new opportunities to solve the challenges. FeFETs have the characteristics of non-volatility, ultra-low power, and high on-off ratio, which are very suitable for memories and Compute-in-Memory (CiM) in high-density, low-power scenarios and would support the implementation of data-intensive applications at the edge. This paper first reviews the development, structure, characteristics, and modeling of FeFETs. Then, the exploration and optimization of FeFET-based memories with different circuit structures and characteristics are discussed. Further, this paper summarizes the FeFET-based CiM circuits, including nonvolatile computing, logic-in-memory, matrix-vector multiplication, and content-addressable memories. Finally, the prospects and challenges of FeFET-based memory and CiM are analyzed.
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