Analysis of Rayleigh-Mode Spurious Response Using Finite Element Method/Spectrum Domain Analysis for Surface Acoustic Wave Resonator on Nonflat SiO<sub>2</sub>/Al/LiNbO<sub>3</sub> Structure

Hiroyuki Nakamura,Hiroyuki Nakanishi,Rei Goto,Ken–ya Hashimoto,M. Yamaguchi
DOI: https://doi.org/10.1143/jjap.49.07hd20
IF: 1.5
2010-01-01
Japanese Journal of Applied Physics
Abstract:Because of their low insertion loss, high out-of-band rejection, and high power durability, miniature surface acoustic wave (SAW) duplexers are widely used in mobile phones. Substrate materials substantially limit and determine the performance of SAW duplexers; for their applications to Band I and Band IV systems with large pass-band widths and wide frequency separations between the transmitting and receiving frequency bands, a larger coupling coefficient ( K 2 ) is of primary importance. We have developed a shape-controlled SiO 2 film/Al electrode/LiNbO 3 substrate structure for their applications. It could lead to a large K 2 and suppression of Rayleigh-mode spurious response. In this paper, we report the analysis using finite element method/spectrum domain analysis (FEM/SDA) for the SAW resonator on a nonflat SiO 2 film/Al electrode/LiNbO 3 structure. It was clarified that the shape-controlled SiO 2 was effective in terms of achieving a large K 2 for the SAW resonator with suppressed Rayleigh-mode spurious responses and bulk wave radiation. Furthermore, the experiment results showed a good agreement with the analysis results.
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