A New Dynamic Testing Technique of Light Scanning

Shu Xiaowu

1998-01-01

Abstract:In this paper, the new photo-electric position sensitive detector has been detailed, which has advantages of short response time, high resolution and high precision.

What problem does this paper attempt to address?

Design Realization and Characterization of A Position Sensitive Detector for Fast Optical Measurement

XJ Qi,B Lin,DY Chen,XQ Cao,YP Chen

DOI: https://doi.org/10.1117/1.2151807

IF: 1.3

2006-01-01

Optical Engineering

Abstract:The fabrication and testing results of a 65-pin ceramic packaged 4 x 4 arrayed position sensitive detector are presented. The detector, consisting of 16 tetra-lateral sensitive areas, is a p-n-n+ configuration made on 3-in. < 111 > n-type high resistance crystal silicon substrates. A 100-nm antireflection SiO2 thin film is formed on the surface, along with a multilayer cover glass with transmissivity > 98% from 400 to 950 nm. Primary tests of the device show that it has a low dark current, high spectral sensitivity, very fast response speed, and very good linearity. The dark current of an element unit is less than 20 nA, which is the allowable maximum dark current. The peak spectral sensitivity of the sensor is over 505 mA/W at 800-nm wavelength. Its response time is 8 ns at 45-V reverse bias and the nonlinearity of the total sensitive area is less than 1%. (c) 2006 Society of Photo-Optical Instrumentation Engineers.
Research on the Technology of Microscanning Photoelectricity

Yan-ling QU,Yong-jun LU,Min SONG

DOI: https://doi.org/10.3969/j.issn.1009-315x.2005.03.002

2005-01-01

Abstract:The difference between the image obtained by microscanning and the single image by computer simulation is compared Due to the fact that the information between the serial images are complementary, the original image can be reconstructed by microscanning. In order to analyse the effect of microsanning on the system performance the pixel transfer function is introduced, the effect of microscanning on PTF is discussed for different fill factors and microscanning pattern and the PTF with the increase of microscanning steps is compared at the Nyquist frequency.
Microscanning Technology in Photoelectric Imaging System

孟海鸿,张新,张建平

DOI: https://doi.org/10.3321/j.issn:1002-1582.2006.z1.123

2006-01-01

Optical Technique

Abstract:Based on the analysis of the microscanning imaging principe,several microscanning equipments around the world are intrduced,and their respective advantages and disadvantages are analyzed,and the key technology will be broken in the microscanning domain.
Research Based on QPD Single-lens Micro-angle Measurement System and Its Key Technology

JIN Wei-feng,LIAN Meng-dong,JU Bing-feng

DOI: https://doi.org/10.3969/j.issn.1005-2895.2011.03.016

2011-01-01

Abstract:A single-lens micro-angle measurement system,which used QPD as position-sensing device is introduced in this paper.In the research,lots of its key technologies about the system have been analyzed such as adopted optical principle,the option and defocussing setting of optical devices like photoelectric detector and calculation and analysis of the feasibility of small size and so on.Through these research,the possibility of designing a compact and portable micro-angle measurement system with high sensibility and small volume was confirmed.Furthermore,the measurement range and accuracy of this micro-angle measurement system are obtained by experiment.
Development of Wide Range Displacement Sensors Based on Polarized Light Detecting Technology

Xiaoping Lu,Wei Li,Yonggang Lin

IF: 0.6

2011-01-01

Optica Applicata

Abstract:A series of novel wide range displacement sensors based on polarized light detecting technology is presented. The sensors include a displacement-current comparator and a servo comparison displacement sensor. Special structures and technologies are introduced to the sensor systems to solve the optical problems, such as the nonlinearity, the light source drift etc., and realize wide range measurement. The designing, assembling, and testing results of the prototypes of sensors are described. The testing results of the prototypes show that the novel sensors based on polarized light detecting technology have good linearity, and wide range measuring ability.
Dynamic scan detection of focal spot on nonplanar surfaces: Theoretical analysis and realization

JianBo Luo,Yiyong Liang,Guoguang Yang

DOI: https://doi.org/10.1117/1.3597327

IF: 1.3

2011-01-01

Optical Engineering

Abstract:A new approach called dynamic-scan-detection is presented to detect the focal spot on nonplanar surfaces, which is a key technique for laser direct writing on nonplanar surfaces. From the depth response properties of a confocal system on a nonplanar surface, the approach scans the axial shift of intensity response peak by oscillating the modified pinhole in the axial direction, and demodulates the defocus by measuring the length of time between two peaks of measured intensity waveform in one period. Compared with conventional methods, this approach features easy implementation, wide depth measurement range without deterioration of the depth discrimination property, dynamically adjustable scan amplitude, and more importantly, suppression of common-mode noise or variable system factors. (C) 2011 Society of Photo-Optical Instrumentation Engineers (SPIE). [DOI: 10.1117/1.3597327]
New photography method of high speed changing process

Yan Zhixin,Jiang Ping,Wang Houyu,Liu Liping

DOI: https://doi.org/10.3321/j.issn:1000-6915.2001.04.024

2001-01-01

Abstract:Through analysing the testing principle of two dimensional particle motion and applying the technology of high narrow gap scanning photography, a new testing system is established. This system can register the locus and velocity of two dimensional particle motion, thus widen the study field of high speed narrow gap scanning photography from one dimensional case to two dimensional case.
High-performance digital shearography integrating spatial light modulator with micro-polarizer camera

Yanfeng Yao,Yonghong Wang,Zihua Zheng,Biao Wang,Junrui Li

DOI: https://doi.org/10.1016/j.optlaseng.2024.108077

IF: 5.666

2024-02-02

Optics and Lasers in Engineering

Abstract:Digital shearography (DS), a laser-based optical interferometric method, is widely employed for measuring the first-order derivative of an object's surface deformation. Unlike digital holography, DS integrates self-reference optics, enhancing resistance to environmental disturbance and improving detection sensitivity, making it ideal for non-destructive testing (NDT). DS finds applications in diverse fields such as material inspection, fluid property research, medical diagnostics, cultural heritage restoration, and military defense. The conventional temporal phase-shift (TPS) method encounters limitations in dynamic tests, leading to the introduction of the spatial phase-shift (SPS) method. However, SPS is restricted by aperture size, impacting the phase map quality. The spatial light modulator (SLM) introduces a novel approach to DS system development, enabling quantitative shearing adjustments through precise SLM control. Existing DS systems using traditional phase-shift technology rely on interferometers and struggle to achieve high-quality phase maps with a single exposure. The proposed high-performance DS, leveraging both SLM and a micro-polarizer camera, overcomes this limitation, facilitates single-exposure phase map evaluation with the polarization phase-shift technique, and eliminates the need for a tiny aperture, enhancing light beam utilization and phase map quality.

optics
Optical Microscanning X-Ray Real-Time Imaging System

Gao Meijing,Wu Weilong,Xu Wei,Wang Jingyuan

DOI: https://doi.org/10.2991/meic-14.2014.251

2014-01-01

Abstract:As a new non-destructive testing technology, Xray real-time imaging detection technology has been put into practical use in the field of industrial product testing. With the printed circuit boards, integrated circuits increasingly integrated, sizes of the circuit feature are smaller and smaller. The spatial resolution of X-ray imaging systems are increasingly high requirements on the circuit board defect detection. However, the spatial resolution of the existing system can not meet the need for high-resolution imaging. This paper proposes an approach to introducing international advanced optical microscanning technology into existing systems to improve the spatial resolution, thus completing the high-resolution X-ray imaging of fine structure. The definition, the component of the system, working principle, the microscanner and other theory were introduced. Moreover, the successful development of microscanning system can also be applied to other systems to improve the resolution, these systems include the X-ray imaging systems, visible imaging systems, infrared thermal imaging system.
Research on High Precision 3D Measurement Detector Using PSD

ZHU Li-feng,WU Yi-ming,CHEN Liang-yi,ZHAO Tian-yu,Liu Yu-bo

DOI: https://doi.org/10.3969/j.issn.1671-1815.2007.16.037

2007-01-01

Abstract:Optical non-contact measurement in the field of 3D measurement has greatly developed in the last 20 years. Although this technology has achieved great success, its precision is not good enough and it is easy to be effected by the characteristics of measured physical surface. A new schedule is proposed by integrating the measurement module and light source module into one system. Some difficulties while using optical non-contact measurement can be conquered by this new technology.
High-Resolution Dynamic Light Scattering Using A Software Correlator with Analog Detection

Gang Wang,Yan Xue,Zhi-Hui Kang,Yun Jiang,Zhi-Sheng Zhao,Jin-Yue Gao

DOI: https://doi.org/10.1063/1.2336074

IF: 1.6

2006-01-01

Review of Scientific Instruments

Abstract:In this article, a dynamic light scattering (DLS) experimental system with 12.5ns time resolution has been realized based on the use of a photomultiplier tube, a virtual digital storage oscilloscope module, and a personal computer. This experimental system is designed to work on analog detection, in which the photomultiplier output is used directly as an analog signal. Several tests about this system are carried out and the time resolution of this system is demonstrated theoretically and experimentally. From the data and the result, this system is feasible to execute the DLS experiment.
A Fast Pointing Error Analysis System for Photoelectric Detection Mechanisms

Jing Zhou,Huajie Hong,Dapeng Fan

DOI: https://doi.org/10.1109/icpics50287.2020.9202127

2020-01-01

Abstract:This paper proposes a new experimental system for the pointing error analysis of Photoelectric detection mechanisms. The system using embedded system technique to implement the Semi-Parametric Model algorithms to analyze the Pointing Errors rapidly and automatically, which can quicken the signal and data analysis procedure and make the control system highly integrated.
A High Precision Infrared Light-spot Motion Analysis and Measurement System

丁辉,王广志,丁海曙

DOI: https://doi.org/10.3969/j.issn.1002-3208.2003.03.005

2003-01-01

Abstract:A high precision infrared light spot motion analysis and measurement system based on a new type position sensitive detector(PSD)and stereo measurement was developed.This system can detect three dimensional information of moving point rapidly and accurately.Based on it,analysis and calculation were carried out,providing three dimensional coordinates,and also characteristics curves and parameters for concrete applications.This system can be used to detect human body movement for surgical navigation,and so on.
A Brief Review of Photomechanics Progress in Recent 40 Years

WU Xiao-ping

2010-01-01

Abstract:In recent 40years,the theory and technology of photomechanics testing have developed quickly due to the laser emergence.A variety of testing techniques appeared.Especially,after wide application and high speed development of digital image processing hardware and software,the photomechanics technology became a routine testing means for fundamental exploration and solution of practical problems in engineering and played an important role.A brief review of major development of photomechanics in this stage is presented in this article.The laser emergence in sixties of last century promoted the development of optical measurement of experimental mechanics.The development of optical measurement in seventies and eighties of last century was focused on information acquisition.After nineties,the information acquisition ability presented a qualitative change due to the high speed development of digital image processing techniques.Now,the optical measurement of experimental mechanics not only has high sensitivity,but also becomes a routine testing means and a spot testing technique.
Experimental Study of a Novel Detector's Technique for Industrial X-ray Computed Tomography(CT)

WEI Biao,PAN Yin-shong,Xian WU

DOI: https://doi.org/10.3969/j.issn.1000-582x.2001.01.001

2001-01-01

Abstract:Detector, influencing on system's performances, is one of some key techniques in x-ray industrial computed tomography (CT) systems. Considering the existing problems for sensor (or detector) in CT systems, a new sensor is experimented by using optoelectronic integrated technique with optic fiber face-plate optically coupling and transmission, and it is proved to be high integrated, high efficiency, high resolution, and low cost in industrial CT systems.
Single-wired array light detector based on photoacoustic effect

Yaping Li,Yong Fu,Zhong Ji,Xiaodan Li,Yingying Ji,Xu Zheng,Wenjie Mai

DOI: https://doi.org/10.1016/j.optlaseng.2020.106460

IF: 5.666

2021-04-01

Optics and Lasers in Engineering

Abstract:<p>Photoacoustic photodetectors have been widely reported, especially working in energy calibration in photoacoustic tomography. In photoacoustic photodetectors, a point light absorber can be regarded as a pixel, so it is easy to fabricate an array detector with small-sized pixels benefiting to fast high-resolution imaging. Moreover, since the excited photoacoustic (ultrasonic) signals propagate slowly compared to electromagnetic wave, the spatial positions of adjacent absorbers are sufficiently to be distinguished from the time-domain signals. Therefore, it is expected to realize a single-wired array light detector with multi-pixels based on photoacoustic effect, solving the array detector fabrication problem and data acquisition problem caused by multi-pixels. The experimental results show that the proposed photoacoustic photodetector has the superiority to realize broad-spectral and high-resolution light measurement. We expect this detector can be widely used in different fields especially in energy calibration of photoacoustic tomography, broadening the application field of photoacoustic effect.</p>

optics
Design of Low-Light-Level Resolution Testing and Comparing System

Zheng Cao,Qiudong Zhu,Shanshan Wang,Yujiao Guo

DOI: https://doi.org/10.1117/12.2285259

2017-01-01

Abstract:In the comparison and selection of high-sensitivity detectors, the sensitivity, imaging contrast and resolution are important indicators to evaluate the imaging capability. The standard test method of resolution has a high demand for the environment and complicated and inconvenient. In this paper, we introduce a low-light-level resolution testing and comparing system to facilitate and compare and evaluate the sensitivity, imaging contrast and resolution of different high-sensitivity detectors, and provide the basis for the selection of the detector. The pattern of the target plate is designed. The target plate is made of an optically chrome-plated plate and the inner wall of the enclosed system where the optical system is located is coated with a black diffuse paint to reduce the interference of the stray light to the test. According to the sampling theorem, in order to ensure that the narrowest stripes after imaging meet the resolution testing requirements of the detector which has the smallest pixel, the narrowest stripe width of the imaging on the photosensitive surface should be less than 1/2 of the smallest pixel. The use of focusing makes it can still be clearly imaged when there is a small assembly error, but the focusing should not affect the test results. Finally, the system is used in an experiment, testing and comparing the resolution and sensitivity of three detectors, and verify the effectiveness and convenience of the system.
Ultrawide Dynamic Sensing from Single‐Photon Counting to Linear Detection Using a Segmented Superconducting Nanowire

Sai-Ying Ru,Hao,Qing-Yuan Zhao,Zhi-Jian Li,Hao Liu,Zhen Liu,Jie Deng,Yang-Hui Huang,Fan Yang,Nai-Tao Liu,Chao Wan,Xue-Cou Tu,La-Bao Zhang,Xiao-Qing Jia,Jian Chen,Lin Kang,Pei-Heng Wu

DOI: https://doi.org/10.1002/lpor.202400483

2024-01-01

LASER & PHOTONICS REVIEWS

Abstract:Despite their exceptional sensitivity, single photon detectors typically exhibit limited tolerance to strong light compared to conventional linear photodetectors. Consequently, a disparity arises between these two detector types, hindering the achievement of both high sensitivity and high dynamic range in sensing and imaging. To bridge this gap, a segmented architecture is implemented with a waveform‐variance readout scheme for extacting high‐flux photon informaiton.This approach gives an unprecedented ultra‐high dynamic range of 75 dB at a fixed bias current, where single photon counting mode and quasi‐linear photodetection mode coexist. High‐dynamic imaging, passive thermal imaging, and joint active and passive imaging are demonstrated, which validate the advantages of this dual‐mode detector. Such a versatile detector will offer enhanced flexibility, single‐photon sensitivity, as well as ultra‐wide dynamic range across various scientific and technical domains.
Single-photon Detection with Synchronizing Photo and Electric Switches

Jun WANG,Yuan LIU,Shuang-li DONG,Guo-feng ZHANG,Lian-tuan XIAO,Suo-tang JIA

2008-01-01

Abstract:A new method is introduced for single photon detection synchronously based on photo-electric switches. The method can suppress background photon noise, and avoid the afterpulses and dead time effect in single photon detection caused by background photons effectively. In this way, the signal to noise ratio is improved in single photon detection. Furthermore, the method can avoid the single-photon-detector s electroluminescence effect when it works commonly under the gated-mode for single photon detection synchronously.
Asymmetric Light Excitation for Photodetectors Based on Nanoscale Semiconductors.

Shuang Liang,Feifan Wang,Ze Ma,Nan Wei,Gongtao Wu,Gang Li,Huaping Liu,Xiaoyong Hu,Sheng Wang,Lian-Mao Peng

DOI: https://doi.org/10.1021/acsnano.6b06598

IF: 17.1

2016-01-01

ACS Nano

Abstract:A photodetector is a key device to extend the cognition fields of mankind and to enrich information transfer. With the advent of emerging nanomaterials and nanophotonic techniques, new explorations and designs for photodetection have been constantly put forward. Here, we report the asymmetric-light-excitation photoelectric detectors with symmetric electrical contacts working at zero external bias. Unlike conventional photodetectors with symmetric contacts which are usually used as photoconductors or phototransistors showing no photocurrent at zero bias, in this device, the asymmetric-light-excitation structure is designed to ensure that only one Schottky junction between two metallic electrodes and semiconductors is illuminated. In this condition, a device can contribute to a photocurrent without bias. Furthermore, incident light with global illumination will be redistributed by the top Au patterns on devices. The achievement of detectors benefits from the designed redistribution of optical field on specific Schottky barriers within optically active regions and effective carrier collection, producing unidirectional photocurrent for large-scale detection applications. The response mechanisms, including excitations under different polarizations, wavebands, and tilted incidences, were systematically elaborated. Device performances including photocurrent, dynamic response, and detectivity were also carefully measured, demonstrating the possibility for applications in high-speed imaging sensors or integrated optoelectronic systems. The concept of asymmetric-light-excitation photodetectors shows wider availability to other nanomaterials for modern optoelectronics.

A New Dynamic Testing Technique of Light Scanning

Design Realization and Characterization of A Position Sensitive Detector for Fast Optical Measurement

Research on the Technology of Microscanning Photoelectricity

Microscanning Technology in Photoelectric Imaging System

Research Based on QPD Single-lens Micro-angle Measurement System and Its Key Technology

Development of Wide Range Displacement Sensors Based on Polarized Light Detecting Technology

Dynamic scan detection of focal spot on nonplanar surfaces: Theoretical analysis and realization

New photography method of high speed changing process

High-performance digital shearography integrating spatial light modulator with micro-polarizer camera

Optical Microscanning X-Ray Real-Time Imaging System

Research on High Precision 3D Measurement Detector Using PSD

High-Resolution Dynamic Light Scattering Using A Software Correlator with Analog Detection

A Fast Pointing Error Analysis System for Photoelectric Detection Mechanisms

A High Precision Infrared Light-spot Motion Analysis and Measurement System

A Brief Review of Photomechanics Progress in Recent 40 Years

Experimental Study of a Novel Detector's Technique for Industrial X-ray Computed Tomography(CT)

Single-wired array light detector based on photoacoustic effect

Design of Low-Light-Level Resolution Testing and Comparing System

Ultrawide Dynamic Sensing from Single‐Photon Counting to Linear Detection Using a Segmented Superconducting Nanowire

Single-photon Detection with Synchronizing Photo and Electric Switches

Asymmetric Light Excitation for Photodetectors Based on Nanoscale Semiconductors.