Confocal Image 3D Surface Measurement with Optical Fiber Plate

Wei Zhao,Shining Zhu,Bing Li,Yushan Tan
2004-01-01
Abstract:A whole-field 3D surface measurement system for semiconductor wafer inspection is described.The system consists of an optical fiber plate,which can split the light beam into N2 subbeams to realize the whole-field inspection.A special prism is used to separate the illumination light and signal light.This setup is characterized by high precision,high speed and simple structure.
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