Study on Inter-Turn Short Circuit Fault of Dry-Type Air-Core Shunt Reactor under Low Voltage with Low Frequency

Yumin Peng,Man Zhang,Ying Liu,Shi Jing,Qi Huang
DOI: https://doi.org/10.1109/ei256261.2022.10116776
2022-01-01
Abstract:When the inter-turn short circuit fault occurs in the dry-type air-core shunt reactor (DASR), the short circuit loop will consume a large amount of active power, which will cause the equipment temperature to rise in a short time and damage the equipment. Therefore, it is very important to detect the fault in the early stage of the inter-turn short circuit fault. This paper presents a method to detect the number of inter-turn short circuit fault turns of the DASR based on modified active power (P m ) and modified reactive power (Q m ), at low voltage with low frequency. The formulas for Pm and Q m are obtained by adding correction factors to the formulas for active power and reactive power respectively. Their correction factors are obtained by using genetic algorithm. The variations of Pm and Q m under normal condition and short circuit condition with different turns are studied. The inter-turn short circuit fault with different frequency and different fault location is simulated. It provides a feasible method for detecting the inter-turn short circuit fault of the DASR and determining the number of short circuit turns.
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