Transverse Spurious Mode Free SAW Resonators and Delay Line on GaN/Si with High Quality Factor

Guofang Yu,Renrong Liang,Haiming Zhao,Jun Fu,Tian-Ling Ren
DOI: https://doi.org/10.1109/edtm55494.2023.10102990
2023-01-01
Abstract:This work presents a dummy finger structure for eliminating the transverse spurious mode on the GaN/Si surface acoustic wave (SAW) resonators. The fabricated resonators have a high quality factor, and the transverse spurious mode is effectively suppressed. A maximum quality factor of 8177 at a resonant frequency (f(r)) of 1.9173 GHz is obtained. Moreover, it is shown that the transverse spurious mode is independent of the propagation directions. A delay line with the dummy finger shows a minimum insertion loss of 16.44 dB. These results could pave the way for future intelligent lab-on-chip sensor applications.
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