A High Efficiency X-band Internally-Matched GaN Power Amplifier Using On-Chip Harmonic Tuning Technology

Liming Gu,Baojing Yang,Wenjie Feng,Wenquan Che
DOI: https://doi.org/10.1109/imws-amp54652.2022.10106866
2022-01-01
Abstract:In this work, a high power added efficiency (PAE) X-band internally-matched GaN power amplifier is demonstrated, the on-chip second-harmonic tuning cell is employed with the GaN transistor die to improve the efficiency. The GaN HEMT was well-designed so that the resonant circuit for second-harmonic input impedance control was integrated in each cell of the GaN transistor die. By using the on-chip harmonic tuning FET, the developed internally-matched amplifier has achieved the highest more than 60% PAE with over 70 W output power under continues-wave (CW) operating conditions at X-band. As far as we know, this device shows the highest PAE in the X-band.
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