Abstract:The single-event transient response of a high-voltage complementary SiGe-on-silicon-on-insulator technology is investigated along with its temperature dependence using a pulse laser. The p-n-p silicon-germanium heterojunction bipolar transistor (SiGe HBT) shows a larger transient peak amplitude compared to the n-p-n SiGe HBT, which is largely related to the differences in total device volume and peak germanium content between the p-n-p and n-p-n devices. The effects of temperature on the transient response are also investigated using heaters and sensors mounted directly on the device-under-test package. The collector transient peak amplitude shows a negative temperature coefficient for a <inline-formula> <tex-math notation="LaTeX">$V {_{\text {CB}}}$ </tex-math></inline-formula> of 0-V condition, for both the n-p-n and p-n-p devices. However, the temperature dependence of the transient peak amplitude becomes significantly weaker at <inline-formula> <tex-math notation="LaTeX">$V {_{\text {CB}}}>0$ </tex-math></inline-formula> V. Calibrated TCAD simulations were performed to better understand the temperature dependence, and the simulations indicated that the electric field and mobility at higher <inline-formula> <tex-math notation="LaTeX">$V {_{\text {CB}}}$ </tex-math></inline-formula> have a reduced temperature dependence than at a <inline-formula> <tex-math notation="LaTeX">$V {_{\text {CB}}}$ </tex-math></inline-formula> of 0 V. The effects of self-heating are also explored using TCAD simulations and show that even under aggressive self-heating conditions, there is only less than 10% reduction in transient peak amplitude with the self-heating models turned on. The results shown suggest that this particular SiGe technology can be used for environments where highly energetic particles and high temperatures are encountered simultaneously.

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Experimental study of bias dependence of pulsed laser-induced single-event transient in SiGe HBT

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3-D Simulation Study of Single Event Effects of SiGe Heterojunction Bipolar Transistor in Extreme Environment

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