Abstract:Normal flat panel X-ray detectors are confined in imaging of curved surfaces and three-dimensional objects. Except that, their rigid panels provide uncomfortable user experience in medical diagnosis. Here, we report a flexible X-ray detector fabricated by the combination of a lead-free Cs2TeI6 perovskite film and a polyimide (PI) substrate. High-quality Cs2TeI6 polycrystalline films are prepared by a low-temperature electrospraying method. The resistivity even remained at the level of 1011 Ω·cm after 100 cycles of bending tests with a low bending radius of 10 mm. The resulting flexible Cs2TeI6 detectors exhibit better response stability than those based on rigid SnO2:F glass (FTO), which is attributed to the superior crystallization of films and the growth stress relief of flexible substrates. Furthermore, an X-ray sensitivity of 76.27 μC·Gyair–1·cm–2 and a detection limit of 0.17 μGyair·s–1 are achieved. A series of distortion-free clear X-ray images are obtained for objects with different materials and densities. These findings provide insights into flexible X-ray detectors based on perovskite films and motivate research in wearable X-ray detectors for medical radiography and dose monitoring.The Supporting Information is available free of charge at <a class="ext-link" href="/doi/10.1021/acsami.1c04252?goto=supporting-info">https://pubs.acs.org/doi/10.1021/acsami.1c04252</a>.Detailed process of cyclic bending tests (<a class="ext-link" href="/doi/suppl/10.1021/acsami.1c04252/suppl_file/am1c04252_si_001.mp4">MP4</a>)Equipment diagram and crystal structure, stimulation of the electric field, calculation of resistivity, characterization of detector stability, calculation of attenuation efficiency, detection limit, and calculation of sensitivity (<a class="ext-link" href="/doi/suppl/10.1021/acsami.1c04252/suppl_file/am1c04252_si_002.pdf">PDF</a>)This article has not yet been cited by other publications.

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