Direct X.ray Detectors Based on PDMS Films with Low Detection Limit and High Flexibility

Yi Li,Hu Chen,Zhao Hao,Zuhao Li,Xingyang Wu,Xifeng Li,Jianhua Zhang
DOI: https://doi.org/10.1109/led.2022.3205754
IF: 4.8157
2022-01-01
IEEE Electron Device Letters
Abstract:The excellent mechanical properties of Polydimethylsilane (PDMS) has been widely used in hybrid flexible photodetectors, but there is hardly any research on it as the active layer of the direct X-ray detectors. In this letter, the low detection and high flexibility X-ray detector was fabricated based on pure PDMS. The metal/polymer/metal (MPM) vertical structure detector has a detection limit of 49.69 nGy <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$_{air}\text{s}$ </tex-math></inline-formula> −1. Carrier migration occurs in PDMS under X-ray irradiation with the sensitivity of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$57.7~\mu \text{C}$ </tex-math></inline-formula> Gy <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$_{air}^{-1}$ </tex-math></inline-formula> cm−2 at the electric field of 2 V/ <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\mu \text{m}$ </tex-math></inline-formula> and the dose rate of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$23.9~\mu $ </tex-math></inline-formula> Gy <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$_{air}$ </tex-math></inline-formula> s−1. The device still maintains a good performance after bending tests (different bending radius and 10000 cycles). This work provides a new possibility for the next development of direct X-ray detectors.
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