Dynamic Metrology and Data Processing for Precision Freeform Optics Fabrication and Testing
Maham Aftab,Isaac Trumper,Lei Huang,Heejoo Choi,Wenchuan Zhao,Logan Graves,Chang Jin Oh,Dae Wook Kim
DOI: https://doi.org/10.1117/12.2272353
2017-01-01
Abstract:Dynamic metrology holds the key to overcoming several challenging limitations of conventional optical metrology, especially with regards to precision freeform optical elements. We present two dynamic metrology systems: 1) adaptive interferometric null testing; and 2) instantaneous phase shifting deflectometry, along with an overview of a gradient data processing and surface reconstruction technique. The adaptive null testing method, utilizing a deformable mirror, adopts a stochastic parallel gradient descent search algorithm in order to dynamically create a null testing condition for unknown freeform optics. The single-shot deflectometry system implemented on an iPhone uses a multiplexed display pattern to enable dynamic measurements of time-varying optical components or optics in vibration. Experimental data, measurement accuracy / precision, and data processing algorithms are discussed.