Experimental Study on the Effect of Trace Elements in Copper-Chromium Contacts on the Current Cut-off Level of Vacuum Switches

Q. Meng,J. Zou,X. Guo,Y. Li,Q. Han

DOI: https://doi.org/10.1049/icp.2022.1206

2022-01-01

Abstract:The current cut-off phenomenon of vacuum switch will generate high overvoltage in the electrical circuit, which threatens the safety and insulation of electrical equipment. Adding trace elements to the contact material is one of the important measures to reduce the cut-off level of vacuum switch. In this paper, based on the research background of adding trace element Te (tellurium) to CuCr (copper-chromium) contacts, the oscillating circuit and detachable vacuum interrupter are used to measure the interception value of CuCrTe contacts with different additions and different processing techniques, and study the trace elements. The effect of element Te on the cut-off value of CuCr contacts preliminarily proves that the improvement of contact material can affect the level of cut-off value. The results show that adding Te element to the CuCr contact can reduce the cutoff value of the material. As the content of Te element in the contact increases, the cut-off value decreases unidirectionally, and the high-frequency oscillation of arc voltage and current near the cut-off moment is more pronounced. Obviously, it indicates the threat of back-arc heavy breakdown. The experimental results can provide a reference for the comprehensive optimization of copper-chromium contact trace element addition and switch performance indicators.