Effects of Three CuCr Contact Materials on Properties of Back-to-back Capacitor Banks Switching Performance in Vacuum Interrupters

Xiao-jun WANG,Kai LIU,Wen-bin WANG,Xuan AI,Ying-yao ZHANG,He YANG,Yong-hui LI,Zhi-yuan LIU
DOI: https://doi.org/10.3969/j.issn.1671-8887.2014.05.001
2014-01-01
Abstract:This paper investigates the performance of back-to-back capacitor bank switching in vacuum interrupters(VIs) with contacts prepared by three different technologies, including infiltration CuCr50, vacuum induction melting CuCr40Te0.005, and vacuum arc melting CuCr50. Each kind of contacts is installed in three 12 kV VIs and the VIs undergo 80 closing/opening operations of back-to-back capacitor bank switching tests at an inrush current of 8 kA (peak value, frequency 3.8 kHz). Results show that the average values of the restrike probability of the VIs for each contact material are as following: the vacuum induction melting CuCr40Te0.005 is 5.8%; the infiltration CuCr50 is 6.7%; and the vacuum arc melting CuCr50 is 8.3%. For all VIs, the restrikes mainly occur between 1/4T and 10T of the recovery voltage(T, the cycle of the recovery voltage, is 20 ms). Reignition also occurs before 1/4T, and the occurrence number as follows:vacuum induction melting CuCr40Te0.005(1 time)<vacuum arc melting CuCr50(9 times)<infiltration CuCr50(10 times).
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