Dielectric Performances of Vacuum Interrupter Using a New Contact Material-Quanwu Alloy

ZHANG Ying-yao,LIU Zhi-yuan,GENG Ying-san,WANG Ji-mei
DOI: https://doi.org/10.13336/j.1003-6520.hve.2009.08.023
2009-01-01
Abstract:Contact material is one of the key influential factors on vacuum dielectric performance. The dielectric performance in vacuum of a new kind of contact material -Quanwu alloy is studied and compared with CuCr25 and CuCr50 contact material that are widely used in vacuum interrupters. First,basic impulse level (BIL) tests (1.2/50 μs) were done by up-and-down method for the 3 contact materials. The BIL tests revealed that the breakdown probability distribution of the 3 contact materials followed Weibull distribution under different gaps. The 50% breakdown voltage of the 3 contact materials were in the order of CuCr50 Quanwu alloy CuCr25 in the contact gap range from 2 mm to 10 mm. The power frequency dielectric test results show that the dielectric strength of the 3 contact materials is with CuCr50≈Quanwu alloy≈CuCr25 at contact gap 1mm when the rising rate of the power frequency voltage is 3 kV/s. Finally the influence of rising rate of power frequency on the dielectric performance of Quanwu alloy was studied. The results show that the breakdown voltage of Quanwu alloy increases 1.6 times when the rising rate decreases from 3 kV/s to 1.5 kV/s. The experimental results show that the dielectric performance of Quanwu alloy is between CuCr25 and CuCr50 contact materials.
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