Cu3sn Joint for Power Devices - Prepared by Cu@Cu6sn5 Submicron Particles

Jintao Wang,Jianqiang Wang,Fangcheng Duan,Luobin Zhang,Xiangxiang Zhong,Xinjie Wang,Ziwen Lv,Hongtao Chen
DOI: https://doi.org/10.2139/ssrn.4233191
2022-01-01
SSRN Electronic Journal
Abstract:: With the development of high-integration and high-power electronics, the lack of matching chip connecting materials that can withstand high temperatures has been a challenge. In this manuscript, a Cu@Cu 6 Sn 5 core-shell bimetallic particle (approx. 1μm in diameter) is successfully prepared and introduced as a new solder material for the packaging of power devices to obtain a Cu 3 Sn all-IMC solder joint. The joint consisted mainly of equiaxed Cu 3 Sn grains, and a small portion of columnar Cu 3 Sn grains. Equiaxed Cu 3 Sn grain is nucleated at the Cu/Cu 6 Sn 5 interface, and the growth process is controlled by the bulk diffusion of Cu atoms. Columnar Cu 3 Sn is nucleated at the Cu 3 Sn/Cu 6 Sn 5 interface, and the growth process is controlled by the bulk diffusion of Sn atoms. Cu 6 Sn 5 particles provide enough of the Cu/Cu 6 Sn 5 interface to make the joint consist primarily of equiaxed Cu 3 Sn. Shear experiments on the joints reveal recorded a shear strength of approximately 63.2 MPa and 65.2 MPa at room temperature and 300 °C, respectively.
What problem does this paper attempt to address?