Thermal Annealing Effects on I-V-T Characteristics of Pd/Ge/Ti/Pt/Au-Si-Gaas Contact at High Temperatures

Kang Liu,Long Hu,Xin Dang,Xin Li,Weihua Liu,Chuan Yu Han
DOI: https://doi.org/10.2139/ssrn.4004747
2022-01-01
SSRN Electronic Journal
Abstract:Refractory metal (Pd/Ge/Ti/Pt/Au) on semi-insulated GaAs (SI-GaAs) have been prepared and annealed at 380,400 and 425℃. Optical microscope and SEM images show that there is no significant difference in refractory metal surface morphology before and after annealing, compared with the standard AuGeNi electrode of a large number of massive crystals precipitated after annealing, and the specific contact resistivity of Pd/Ge/Ti/Pt/Au-SI-GaAs is the lowest at 400℃ annealing. The current-voltage-temperature (I-V-T) characteristics of the as-deposited and annealed devices have been measured in in the high temperature of 300-400 K with steps of 20 K. The behavior of the forward I-V-T characteristics of inhomogeneous Pd/Ge/Ti/Pt/Au-SI-GaAs contact before and after annealing has been investigated. The experimental results show that the barrier height (Φb) and ideality factor (n) derived from the ideal thermionic emission model were strongly temperature dependent. Such behavior of the parameters is attributed to the inhomogeneous barrier height by assuming a Gaussian distribution at the metal/semiconductor (M/S) interface. We draw Φb versus 1/2kT plots to obtain the mean barrier height (`Φ b ) and standard deviation (σ). The values of` Φb are 1.373 eV, 1.275 eV, 1.199 eV and 0.130 eV, with of 0.205 V, 0.184 V, 0.173 V, and 0.193 V for the as-deposited and 380,400 and 425℃ annealed devices, respectively. A modified ln(I0/T2)-q2σ2/2k2T2 versus 1/kT plots give the mean barrier height(Φb) and Richardson constant(A*). The values of `Φb are consistent with the previous calculations. A* of 6.46 A/K2·cm2 for 400℃ annealed device is in closer agreement with the known value for SI-GaAs. Thus, it has been seen that the morphology of refractory metal electrode is better than that of AuGeNi electrode, and the Pd/Ge/Ti/Pt/Au-SI-GaAs contact by the thermal annealing at 400℃ is expected to be used as electrodes in SI-GaAs photoconductive switch instead of the standard AuGeNi metal.
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