Abstract:Understanding interlayer and intralayer coupling in two-dimensional layered materials (2DLMs) has fundamental and technological importance for their large-scale production, engineering heterostructures, and development of flexible and transparent electronics. At the same time, the quantification of weak interlayer interactions in 2DMLs is a challenging task, especially, from the experimental point of view. Herein, we demonstrate that the use of X-ray absorption spectroscopy in combination with reverse Monte Carlo (RMC) and ab initio molecular dynamics (AIMD) simulations can provide useful information on both interlayer and intralayer coupling in 2DLM 2H$_c$-MoS$_2$. The analysis of the low-temperature (10-300 K) Mo K-edge extended X-ray absorption fine structure (EXAFS) using RMC simulations allows for obtaining information on the means-squared relative displacements $\sigma^2$ for nearest and distant Mo-S and Mo-Mo atom pairs. This information allowed us further to determine the strength of the interlayer and intralayer interactions in terms of the characteristic Einstein frequencies $\omega_E$ and the effective force constants $\kappa$ for the nearest ten coordination shells around molybdenum. The studied temperature range was extended up to 1200 K employing AIMD simulations which were validated at 300 K using the EXAFS data. Both RMC and AIMD results provide evidence of the reduction of correlation in thermal motion between distant atoms and suggest strong anisotropy of atom thermal vibrations within the plane of the layers and in the orthogonal direction.

Reliable and Broad-range Layer Identification of Au-assisted Exfoliated Large Area MoS_2 and WS_2 Using Reflection Spectroscopic Fingerprints

Spectroscopic Ellipsometry Investigation of Au-Assisted Exfoliated Large-Area Single-Crystalline Monolayer MoS2

Rapid and nondestructive layer number identification of two-dimensional layered transition metal dichalcogenides

Substrate-free Layer-Number Identification of Two-Dimensional Materials: A Case of Mo0.5W0.5S2 Alloy

Rapid and reliable thickness identification of two-dimensional nanosheets using optical microscopy.

A Facile Method for Precise Layer Number Identification of Two-Dimensional Materials Through Optical Images

Versatile Optical Determination of Two-Dimensional Atomic Crystal Layers

Rapid and reliable thickness identification of two-dimensional nanosheets using optical microscopy

Determination of the Thickness of Two-Dimensional Transition-Metal Dichalcogenide by the Raman Intensity of the Substrate

Distinct Photoluminescence and Raman Spectroscopy Signatures for Identifying Highly Crystalline Ws2 Monolayers Produced by Different Growth Methods

Rapid Thin-Layer WS2 Detection Based on Monochromatic Illumination Photographs

Thickness-Dependent Differential Reflectance Spectra of Monolayer and Few-Layer MoS2, MoSe2, WS2 and WSe2

Quantitative Raman Spectrum and Reliable Thickness Identification for Atomic Layers on Insulating Substrates

Optical Identification of Single‐ and Few‐Layer MoS2 Sheets

Identifying the Number of WS2 Layers Via Raman and Photoluminescence Spectrum

Layer-number Determination of Two-Dimensional Materials by Optical Characterization

Raman spectra evidence for the covalent-like quasi-bonding between exfoliated MoS 2 and Au films

Distinct photoluminescence and Raman spectroscopy signatures for identifying highly crystalline WS_2 monolayers produced by different growth methods

Unraveling the interlayer and intralayer coupling in two-dimensional layered MoS$_2$ by X-ray absorption spectroscopy and ab initio molecular dynamics simulations

Rapid Thickness Identification Methodology for Two-Dimensional MoS2 and In2 Se3 Nanosheets Using Optical Microscopy

Optical thickness identification of transition metal dichalcogenide nanosheets on transparent substrates.