The Study on the Reflectance and Resistance of Ni/Ag/Ti/Au Electrode Contact to p-GaN

Huang Yaping,Yun Feng,Wen Ding,Wang Yue,Hong Wang,Yukun Zhao
DOI: https://doi.org/10.1149/06001.0539ecst
2014-01-01
ECS Transactions
Abstract:The combination of Ni, Ag, Ti and Au which form both reflective and ohmic multilayer contacts for vertical structure light emitting diode applications are studied. The specific contact resistance and reflectivity under different annealing temperature (200, 300, 400, 500 and 600 ℃) and different annealing atmosphere (nitrogen and oxygen) are measured. The annealing atmosphere of oxygen can lead to lower contact resistance than that of nitrogen as annealing temperature increase. However, a higher annealing temperature will lead to a lower reflectivity, especially in the oxygen atmosphere. Comprehensively considering the reflectance and resistance, we obtain the lowest contact resistivity of 5.5×10-3 Ωcm2 and relatively higher reflectivity of 88% at 450 nm.
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