Analysis of Gate-Source Voltage Spike Generated by Miller Capacitance and Common Source Inductance

Qingshou Yang,Laili Wang,Zhiyuan Qi,Zaojun Ma,Fengtao Yang,Xiaohui Lu
DOI: https://doi.org/10.1109/ECCE-Asia49820.2021.9479360
2021-01-01
Abstract:Compared with Si devices, SIC devices have faster switching speed and higher dv/dt and di/dt. High dr/di through Miller capacitor and high di/dt through common source inductance produce more serious gate-source voltage spike. Meanwhile, limited by the teclmoloo of SiC devices and the characteristics of Sit nratetials, Sit devices have lower gate threshold voltage and lower maximum negative gate voltage. Harsh application environment and fragile SiC devices make it easier for shoot-through and damage. This paper analyzes the mechanism of gate-source voltage spike formed by nonlinear Miller capacitor and common source inductor during turn-on and turn-off, which can better design active gate strive and protection circuit of SIC devices, so as to improve the reliability of devices and converters. Although the turn-on and turn-off processes are mirror symmetrical, due to the different mechanisms of di/dt, dv/dt and the nonlinearity of Miller capacitance, the intensity and polarity of gate source voltage spike generated by Miller capacitor and common source inductor are different. The gate-voltage spike phenomenon is verified by double pulse experiment in this paper.
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