Characterization of Programmable Charge-Trap Transistors (ctts) in Standard 28-Nm CMOS for Nonvolatile Memory and Analog Arithmetic Applications

Yuan Du,Li Du,Wuyu Fan,Yang Xiao,Mau-Chung Frank Chang
DOI: https://doi.org/10.1109/jxcdc.2021.3098469
2021-01-01
IEEE Journal on Exploratory Solid-State Computational Devices and Circuits
Abstract:In this article, we characterized the charge trapping and detrapping behaviors of charge-trap transistors (CTTs) in standard 28-nm CMOS technology and formulated its programmable threshold voltage ( $V_{\mathrm {TH}}$ ). Both thin-oxide and thick-oxide CTT devices are measured, modeled, and analyzed. More than 50- and 100-mV continuous $V_{\mathrm {TH}}$ tuning ranges are achieved for thin and thick oxide devices, respectively. Multiple cycles of programming and erasing operations are demonstrated; however, the reliability needs to be solved in the future. To utilize the developed programmable threshold model, a nonvolatile memory (NVM) cell and an analog arithmetic unit (AAU) are proposed and simulated as two proof-of-concept CTT-based designs.
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