Direct Observation of Optical Band Gap Components in Ga<sub>1-<i>x</i></sub>Zn<i><sub>x</sub></i>N<sub>1-<i>x</i></sub>O<i><s ub>x</sub></i> Solid-Solution Nanoparticles

Matthew Ward,Tom Regier,Johannes Vogt,Wei-Qiang Han,Tsun-Kong Sham
DOI: https://doi.org/10.1021/acs.jpcc.1c04016
2021-01-01
Abstract:Using a time-resolved X-ray excited optical luminescence (TRXEOL) technique and the time structure of the Canadian Light Source, we have observed the decay dynamics of optical emission from a GaN-ZnO (GNZO) solid-solution nanostructure with an optical streak camera, following the excitation with an X-ray pulse (similar to 30 ps width; 570 ns repetition). GNZO is a photocatalyst and its band gap (BG) can be tuned with composition for light-induced water-splitting applications. It is found that the BG optical emission in the UV from the GNZO system, which is totally obscured by the intense defect emission in the visible in X-ray excited optical luminescence (XEOL) without time gating, can be retrieved with time gating at time windows of 0.5-0.6 and 1.45-1.55 ns, yielding narrow BG emission with maximum at 417 and 512 nm, respectively, without defect emission. These findings suggest that the measured optical BG in the solid solution is composed of two separate components, which can be assigned to ZnO and GaN phases in the heterostructure, respectively. This notion is supported by the site sensitivity of the 417 and 512 nm emissions, which are sensitive to excitation channels for ZnO and GaN, respectively.
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