Evolution of the Electronic Structure of C60/La0.67Sr0.33MnO3 Interface

Haipeng Xie,Dongmei Niu,Lu Lyu,Hong Zhang,Yuhe Zhang,Peng Liu,Peng Wang,Di Wu,Yongli Gao
DOI: https://doi.org/10.1063/1.4939457
IF: 4
2016-01-01
Applied Physics Letters
Abstract:The evolution of the electronic structure at the interface between fullerene (C-60) and La0.67Sr0.33MnO3 (LSMO) has been investigated with ultraviolet photoemission spectroscopy and X-ray photoemission spectroscopy. There is a 0.61 eV barrier for the electrons to be injected from LSMO to C-60. The energy bands keep bending upward with increasing C-60 thickness. A total energy bending of 0.72 eV is observed, changing the C-60 film from n-type to p-type. The n-p transition is ascribed to the diffusion of oxygen from LSMO to C-60 which subsequently strips electrons from C-60, making the latter p-type. Our results suggest a buffer layer be inserted between the LSMO and C-60 to lower the interface electron barrier and prevent deterioration of the C-60 film in related spintronic devices. (C) 2016 AIP Publishing LLC.
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