Nanometer Resolution With Dammann Grating Of 50 L(P)/Mm

Dj Lin,Cy Yin
1999-01-01
Abstract:A grating interferometer(GI) system based on transverse Zeeman laser is proposed in this paper. Dammann grating is introduced asa measurement element as well as beam splitter in this system. Nanometer calibration between GI and a differential dual-frequency interferometer (DDFI) is also described in detail. The result of the experiment confirms its good capability of resisting environment disturbance with resolution in the order of nanometer by means of heterodyne signal processing method. Its measurement accuracy reaches +/-25nm under laboratory condition.
What problem does this paper attempt to address?