New Advance In Laser Interferometry

Chunyong Yin,Zhixia X. Chao,Sai Gao,Hong Jiang,Jin Sun
DOI: https://doi.org/10.1117/12.402620
2000-01-01
Abstract:Modern technology development requires interferometry of uttermost quality, which is characterized as high measurement speed, large measurement range, low drift and super-high resolution, good accuracy and efficiency.Firstly this paper introduces a frequency stabilized laser with 5MHz beat frequency which is based on the bi-reflection principle, and a high measurement speed dual-frequency laser interferometer whose allowable displacement velocity is over In's using this kind of laser. Secondly it introduces a transverse Zeeman frequency stabilized laser with 300KHz beat frequency and its applications in nanometer measurement, collimation, coaxiality measurement, roll angle measurement and biomembrane measurement. Thirdly a tunable 633nm external-cavity diode laser (ECL) interferometer is presented.
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