Sintering Behavior, Phase Evolution, And Microwave Dielectric Properties Of Bi(Sb(1-X)Ta(X))O(4) Ceramics

Di Zhou,Hong Wang,Xi Yao,Li-Xia Pang
DOI: https://doi.org/10.1111/j.1551-2916.2008.02462.x
IF: 4.186
2008-01-01
Journal of the American Ceramic Society
Abstract:Sintering behavior, phase evolution, and microwave dielectric properties of Bi(Sb(1-x)Ta(x))O(4) ceramics (0.05 <= x <= 0.60) were studied and their relationships were discussed in detail. Phase studies revealed that a pure monoclinic phase could be formed when x <= 0.20 and a pure orthorhombic phase could be obtained when x >= 0.50. As the x value increased from 0.05 to 0.60, the densified temperature of Bi(Sb(1-x)Ta(x))O(4) ceramics decreased from 1050 degrees to about 960 degrees C whereas the density increased from 8.07 to 8.41 g/cm(3). The microwave dielectric constant increased from 20.5 to 34 whereas the Q x f value decreased from 60 000 to 29 000 GHz. In the monoclinic phase region, the temperature coefficients of resonant frequency shifted linearly from -58 to -45 ppm/degrees C as the x value increased from 0.05 to 0.2 and then remained constant at about -12 ppm/degrees C when x >= 0.40. The Bi(Sb(1-x)Ta(x))O(4) ceramics are promising for application of low-temperature cofired ceramics technology.
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