Orientation and Length Scale Effects on Dislocation Structure in Highly Oriented Nanotwinned Cu

Qiuhong Lu,Xiaoxu Huang,Niels Hansen,Lei Lu

DOI: https://doi.org/10.1088/1757-899x/219/1/012032

2017-01-01

Abstract:Highly oriented nanotwinned Cu has been compressed to 6% strain in directions 90°, 0° and 45° with respect to the twin boundaries of the almost parallel twins. In the 90° and 0° compressed samples Mode I and Mode II dislocations and their interactions with twin boundaries dominate the deformation of twin/matrix (T/M) lamellae with thickness less than 500 nm. In 45° compressed samples, Mode III dislocations, especially partial dislocations moving along the twin boundaries, dominate the deformation of fine T/M lamellae with thickness less than 100 nm, while dislocations from slip Modes I, II and III are identified in T/M lamellae more than 100 nm thick, where these dislocations extensively interact in the T/M lamellae with thicknesses more than 200 nm. Dislocation cells are observed in a twin lamella with a thickness of about 500 nm.