Microstructure and Microwave Dielectric Properties of Sm0.5Y0.5VO4 Ceramics

Jinwu Chen,Yijie Cao,Chunchun Li,Liang Fang
DOI: https://doi.org/10.1088/1757-899x/423/1/012071
2018-01-01
IOP Conference Series Materials Science and Engineering
Abstract:Sm0.5Y0.5VO4 ceramics were prepared through the solid-state reaction method. Sintering behavior and microstructure of samples were studied via scanning electron microscopy techniques, X-ray diffraction, and rietveld refinement. A purity phase with tetragonal zircon-type and dense microstructure were obtained in Sm0.5Y0.5VO4 sintered at 1225 °C- 1325 °C for 4 h. The best microwave Dielectric properties of Sm0.5Y0.5VO4 ceramic with a dielectric constant∼10.98, a Q×f value ∼ 34197 GHz, and a temperature coefficient of resonant frequency∼ -43.6 ppm/°C sintered at 1275 °C for 4 h. Sm0.5Y0.5VO4 ceramic has excellent microwave properties. If the sintering temperature can be reduced, it may be a potential candidate for microwave devices application.
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