Microwave Dielectric Properties of Temperature‐stable Zircon‐type (bi, Ce)VO4 Solid Solution Ceramics

Huan-Huan Guo,Di Zhou,Wen-Feng Liu,Li-Xia Pang,Da-Wei Wang,Jin-Zhan Su,Ze-Ming Qi
DOI: https://doi.org/10.1111/jace.16759
IF: 4.186
2019-01-01
Journal of the American Ceramic Society
Abstract:In the (Bi1 - xCex)VO4 (0 <= x <= 1) system, we found that the (Bi1 - xCex)VO4 (0 <= x <= 0.1) belongs to the monoclinic scheelite phase and the (Bi1 - xCex)VO4 (0.7 <= x <= 1) belongs to the tetragonal zircon phase, while the (Bi1 - xCex)VO4 (0.1 x < 0.7) belongs to the mixed phases of both monoclinic scheelite and tetragonal zircon structure. Interestingly, two components with near-zero temperature coefficient of resonant frequency (TCF) appeared in this system. In our previous work, a near-zero TCF of similar to+15 ppm/degrees C was obtained in a (Bi0.75Ce0.25)VO4 ceramic with a permittivity (epsilon(r)) of similar to 47.9 and a Qf (Q = quality factor = 1/dielectric loss; f = resonant frequency) value of similar to 18 000 GHz (at 7.6 GHz). Furthermore, in the present work, another temperature-stable microwave dielectric ceramic was obtained in (Bi0.05Ce0.95)VO4 composition sintered at 950 degrees C and exhibits good microwave dielectric properties with a epsilon(r) of similar to 11.9, a Qf of similar to 22 360 GHz (at 10.6 GHz), and a near-zero TCF of similar to+6.6 ppm/degrees C. The results indicate that this system might be an interesting candidate for microwave device applications.
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