Probing the infrared properties of a p -doped Ge0.938Sn0.062 thin film via polarization-dependent FTIR spectroscopy

B. N. Carnio,B. Shahriar,A. Attiaoui,M. R. M. Atalla,S. Assali,O. Moutanabbir,A. Y. Elezzabi
DOI: https://doi.org/10.1063/5.0187087
IF: 4
2024-02-12
Applied Physics Letters
Abstract:The complex relative permittivity of doped Ge1−xSnx thin films (realized using state-of-the-art growth techniques) are obtained by devising a methodology based upon polarization-dependent reflection measurements along with multi-layer Fresnel reflection equations. The developed approach is implemented to acquire the complex relative permittivity of a 170-nm-thick Ge1−xSnx film exhibiting a hole carrier concentration of 3.3 × 1019 cm−3 and x = 6.2%, with this Sn composition suggesting the film is on the cusp of exhibiting a direct bandgap. The investigation conducted on this thin film as well as the developed methodology are expected to further establish Ge1−xSnx as the primary semiconductor for on-chip light emission and sensing devices.
physics, applied
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