Direct-bandgap GeSn grown on silicon with 2230 nm photoluminescence

Seyed Amir Ghetmiri,Wei Du,Joe Margetis,Aboozar Mosleh,Larry Cousar,Benjamin R. Conley,Lucas Domulevicz,Amjad Nazzal,Greg Sun,Richard A. Soref,John Tolle,Baohua Li,Hameed A. Naseem,Shui-Qing Yu
DOI: https://doi.org/10.1063/1.4898597
IF: 4
2014-10-13
Applied Physics Letters
Abstract:Material and optical characterizations have been conducted for epitaxially grown Ge1−xSnx thin films on Si with Sn composition up to 10%. A direct bandgap Ge0.9Sn0.1 alloy has been identified by temperature-dependent photoluminescence (PL) study based on the single peak spectrum and the narrow line-width. Room temperature PL emission as long as 2230 nm has also been observed from the same sample.
physics, applied
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