Impact of Bottom Electrode Roughness on the Analog Switching Characteristics in Nanoscale RRAM Array.

Wenbin Zhang,Jianshi Tang,Bin Gao,Wen Sun,Wei Liu,Kanwen Wang,Wei Wu,He Qian,Huaqiang Wu
DOI: https://doi.org/10.1109/drc52342.2021.9467220
2021-01-01
Abstract:Computing-in-memory (CIM) architecture based on emerging resistive switching memories shows great potential to build energy-efficient hardware for artificial intelligence applications. For resistive random-access memory (RRAM), the bottom electrode (BE) roughness has been shown to impact the electrical characteristics [1] – [3] . However, previous works mainly focus on the effect of BE roughness o...
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