Thickness Dependenceof Superconducting Properties of MgB2 THIN FILMS on Al2O3 Substrates

Xiaojing WANG,Chen ZHANG,Yan ZHANG,Qingrong FENG,Yue WANG

2016-01-01

Abstract:It has been recently recognized that MgB2 ultrathin films have good prospects in developing novel superconducting electronic devices.Investigating their superconducting properties has also important implications in exploring the phenomenon of multiband superconductivity in low-dimensions.On (0001) Al2 O3 substrates we have grown a series of MgB2 thin films with thicknesses d varying between 50 and 10 nm by employing the hybrid physical-chemical vapor deposition method and studied the thickness dependence of characteristic parameters of the films such as the superconducting transition temperature Tc,the residual resistivity ratio RRR,and the upper critical field Hc2 by measuring the temperature dependence of resistivity in zero and different applied magnetic fields.It has been observed that the Hc2 (T) exhibits a linear temperature dependence for all samples,clearly indicating the two-band superconductivity in MgB2 thin films.As d reduces,overall,the Tc and RRR of the films are shown to drop and the Hc2 (0) at 0 K rises.It has been further found that the Tc and Hc2 (0) of the films show in approximate a monotonic dependence on the RRR,with Tc decreasing and Hc2 (0) increasing as the RRR decreases,suggesting the RRR as an important factor in influencing the superconducting properties of the fabricated MgB2 ultrathin films.By analyzing the above phenomenon within the framework of two-band superconductivity,it is proposed that the interband scattering between electrons from σ band and π band in MgB2 may be intensified as the RRR of the films decreases.