Research on the X-ray Spot Tracing and the Position Resolution of THGEM Detector

Chuanfeng LIU,Xiaojuan ZHOU,Jianrong ZHOU,Liming LU,Lin ZHU,Cong HE,Yingying TAN,Hong XU,Yuguang XIE,Xiaodong WANG,Jinjie WU,Yuanbo CHEN,Zhijia SUN
DOI: https://doi.org/10.11804/NuclPhysRev.35.01.061
2018-01-01
Abstract:This paper introduces the detector of X-ray spot tracing based on the THGEM.It is used for X ray single photon measurement technology research and measurement with an effective area of 200 mm × 200 mm.The circuit board has 128 array of high speed readout electronics based on ASIC and FPGA.And it is divided into two parts:the middle area of high sensitive and the peripheral area of low sensitive.The two parts share a set of readout electronics.The experiment tests the position and the fine structure of the beam line produced by X ray machine in National Institute of Metrology.The results of the experimental show that the detector realizes both the spot tracing and the fine structure of the spot.The position resolution is 0.63 mm in x direction and 0.62 mm in y direction in high sensitive of the detector,which achieve the desired goal of preliminary design.
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