Determination for the Yield Strength of Matrix in a SiCw/Al Composite by the X-ray Diffraction

JIANG Chuan-hai,WU Jian-sheng,WANG De-zun

DOI: https://doi.org/10.3969/j.issn.1001-4381.2001.04.012

2001-01-01

Journal of Materials Engineering

Abstract:According to the principle of stress measurement by X-ray diffraction, the test method of matrix yield strength in composites was established. The actual yield strength of matrix in a 20vol%SiCw/Al composite was measured. The results show that, the matrix yield strength in the composite is obviously higher than that of single matrix material. The matrix strengthening in the composite is mainly due to high dislocation density and fine sub-gain.