An Air Refractometer with Dual Vacuum Chambers Based on the Method of Equivalent Synthetic Wave

陈强华,闫聚群,柳忠尧,殷纯永,叶孝佑,许婕
DOI: https://doi.org/10.3321/j.issn:1000-1158.2004.03.003
2004-01-01
Abstract:The error resulted from air refractive index should be corrected in-situ for the high accuracy measurement. A concept named as an equivalent synthetic wave is presented, based on which a novel air refractometer is developed. It has two virtual waves by adopting two vacuum chambers with different lengths. This air refractometer takes the advantages of compact structure and the ability of real-time correction of air refractive index in high accuracy measurement. The resolution of the refractometer is 1×10~(-8), and the experiment results comparing with the method of Edlen equation showing that the apparatus has good stability with an accuracy better than 1×10~(-7).
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