Understanding board level vibrations in automotive electronic modules
V. Thukral,R. Roucou,C. Chou,J.J.M. Zaal,M. van Soestbergen,R.T.H. Rongen,W.D. van Driel,G.Q. Zhang
DOI: https://doi.org/10.1016/j.microrel.2024.115430
IF: 1.6
2024-06-26
Microelectronics Reliability
Abstract:Board level reliability can be of high interest for automotive electronic components when exposed to vibration-prone environments. However, the absence of an industry standard for board level vibration testing poses several challenges in establishing a well-characterized test setup. One of the challenges is that automotive applications can induce abnormal stresses on components that can lead to early failures in the field. Such loading conditions are not always covered in the current board level vibration test methods. This paper aims to correlate the stresses from automotive modules to board levels by measuring the printed circuit board (PCB) vibration spectrum. Firstly, the study compares and assesses several module board level vibration measurement units, such as LASER Doppler Vibrometer (LDV), strain gauges, and accelerometers. Experiments and simulations show that LDV enables good correlation with Micro-electro Mechanical Systems (MEMS) accelerometers. Secondly, the module-board interaction unveils insights into several module design features that impact the PCB vibration response and solder joint interconnect reliability. These findings underscore the necessity for the user to correctly validate the reliability of packages beyond board level testing, i.e., at the module level. This reliability test approach enables the translation of reliability test results from the lab to the field life of components once built in the final application equipment.
engineering, electrical & electronic,nanoscience & nanotechnology,physics, applied