Effects of defect-control on photoelectric response and recovery properties of ZnO nanorod arrays

Huiqiong PENG,Changsheng XIE,Qiang ZHU,Chunlei ZHANG,Zhen JIA
DOI: https://doi.org/10.3969/j.issn.1001-9731.2017.07.030
2017-01-01
Abstract:In this paper, the intrinsic defects in ZnO nanorod array films are adjusted through the annealing treatment.The annealing treatments are conducted both in air and nitrogen at different temperatures.When annealed in oxygen, the concentration of oxygen vacancy and zinc vacancy increased with the increasing annealing temperature.When annealed in nitrogen at high temperatures, the concentration of oxygen vacancy increased while the zinc vacancy was vanished due to the low oxygen pressure.The annealed ZnO nanorod arrays behaved more remarkable photoelectric recovery efficiency (improved 40 times maximumly).Nevertheless, the changes of oxygen vacancy concentration brought the decrease of concentration of photogenerated carriers.Thus, the annealed ZnO nanorod arrays behaved degenerate response rate than ZnO nanorod array without annealing treatment.
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