Detection method of subsurface damage of silicon carbide after grinding

Jian WANG,Feifei ZHENG,Zhigang DONG,Renke KANG,Jinting LIU,Dongming GUO
DOI: https://doi.org/10.13394/j.cnki.jgszz.2015.4.0013
2015-01-01
Abstract:Reaction bonded silicon carbide (RBSiC) is widely used in space optics area for its brilliant physical and mechanical characters.In this paper,the grinding experiments of RBSiC were performed using a diamond grinding wheel.A cross-section microscopy method and an angle polishing method were used to detect subsurface damage separately.The results showed that the angle polishing method could measure the depth of damage more accurately,and that the cross-section microscopy method could reveal the topography of damage more clearly.Subsurface damage was mainly generated on SiC particles,and could be classified as two categories,namely pits closed to surface and large cracks. Grain grit has great influence on the depth of subsurface damage.
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