Mechanical effect of abrasives on silicon surface in chemo-mechanical grinding

Zhang Yu,Renke Kang,Jiawei Ren,Hongye Lang,Shang Gao
DOI: https://doi.org/10.1016/j.ijmecsci.2023.108544
IF: 7.3
2023-06-11
International Journal of Mechanical Sciences
Abstract:To obtain high-quality surfaces and subsurfaces of ground silicon wafers, chemo-mechanical grinding (CMG) for silicon has been developed by inducing chemical reactions into grinding. Chemical reactions between abrasives and silicon during CMG process have been proved in previous studies. The mechanical effect of abrasives in CMG process is not fully understood. To investigate abrasives' mechanical effect on material removal and subsurface damage of silicon in CMG process, silicon nanoscratching experiments with CeO 2 indenter under a progressive normal load were conducted, and microtopographies of scratch surface and subsurface were observed. For comparison, silicon nanoscratching experiments with diamond indenter were also conducted. Finite element models of silicon nanoscratching with CeO 2 and diamond indenters were built to investigate the relationship between stress distribution and damage evolution of silicon. Experimental investigations and simulation results indicate that no obvious material removal of silicon or serious subsurface damage is generated by CeO 2 indenter's mechanical action because the wear of CeO 2 indenter leads to the release of the stress on silicon. Material removal of silicon during CMG process relies on chemical reactions between soft abrasives and silicon other than stress on silicon generated by soft abrasives.
engineering, mechanical,mechanics
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