Abstract:The development of a true random number generator (TRNG) based on stochastic ferroelectric polarization switching in 2D CuInP2S6 materials, is reported. The TRNG exhibits exceptional stochastic variability, surpassing conventional entropy metrics, and passes the National Institute of Standards and Technology (NIST) randomness tests. Moreover, TRNG's unclonability is demonstrated through device‐to‐device variation, providing resilience against machine learning (ML) attacks. True random number generators (TRNGs), which create cryptographically secure random bitstreams, hold great promise in addressing security concerns regarding hardware, communication, and authentication in the Internet of Things (IoT) realm. Recently, TRNGs based on nanoscale materials have gained considerable attention for avoiding conventional and predictable hardware circuitry designs that can be vulnerable to machine learning (ML) attacks. In this article, a low‐power and low‐cost TRNG developed by exploiting stochastic ferroelectric polarization switching in 2D ferroelectric CuInP2S6 (CIPS)‐based capacitive structures, is reported. The stochasticity arises from the probabilistic switching of independent electrical dipoles. The TRNG exhibits enhanced stochastic variability with near‐ideal entropy, uniformity, uniqueness, Hamming distance, and independence from autocorrelation variations. Its unclonability is systematically examined using device‐to‐device variations. The generated cryptographic bitstreams pass the National Institute of Standards and Technology (NIST) randomness tests. This nanoscale CIPS‐based TRNG is circuit‐integrable and exhibits potential for hardware security in edge devices with advanced data encryption.

Robust True Random Number Generator Using Stochastic Short-term Recovery of Charge Trapping FinFET for Advanced Hardware Security

Implementation of A Chaos-Based ,High-Speed Truly Random Number Generator

A True Random Number Generator Based on Semiconductor-Vacancies Junction Entropy Source and Square Transform Method

A High-Speed True Random Number Generator Based on Unified Selector-RRAM

RHS-TRNG: A Resilient High-Speed True Random Number Generator Based on STT-MTJ Device

A Low-Power and High-Speed True Random Number Generator Using Generated RTN

High-speed True Random Number Generator Based on Differential Current Starved Ring Oscillators with Improved Thermal Stability

A Lightweight Full Entropy TRNG With On-Chip Entropy Assurance

Lightweight Hybrid Entropy Source True Random Number Generator Based On Jitter and Metastability

Design and Implementation of a True Random Number Generator Based on MOSFET Thermal Noise

A True Random Number Generator Based on Parallel Stt-Mtjs

A Novel Leaky-FeFET Based True Random Number Generator with Ultralow Hardware Cost for Neuromorphic Application

FerroCoin: Ferroelectric Tunnel Junction-Based True Random Number Generator

A RRAM-Based True Random Number Generator with 2T1R Architecture for Hardware Security Applications

Ferroelectric Stochasticity in 2D CuInP2S6 and Its Application for True Random Number Generator

A Novel Circuit Design of True Random Number Generator Using Magnetic Tunnel Junction

A Metastability-Based True Random Number Generator On Fpga

A High Speed All-Digital True Random Number Generator

A 0.186-pJ per Bit Latch-Based True Random Number Generator Featuring Mismatch Compensation and Random Noise Enhancement

Design and Realization of True Random Number Generator Based on Physical Noise Source

A Spin Orbit Torque Based True Random Number Generator with Real-Time Optimization