A 2.22 Mb/s True Random Number Generator Based on a GeTe x Ovonic Threshold Switching Memristor

Yuyang Fu,Jinyu Wen,Lun Wang,Ling Yang,Qihang Zhu,Wenbin Zuo,Puyi Zhang,Yi Li,Hao Tong,Guokun Ma,Hao Wang,Xiangshui Miao
DOI: https://doi.org/10.1109/led.2023.3259000
IF: 4.8157
2023-04-28
IEEE Electron Device Letters
Abstract:True random number generators (TRNGs) based on threshold switching memristors emerge as a building block for secure electronics. However, the throughputs reported in previous studies have a stark gap with the requirements of practical applications ( 1 Mb/s). Here, we implement a high-speed TRNG with a GeTex ovonic threshold switching (OTS) memristor. The TRNG throughput reaches 2.22 Mb/s for a single cell, which is 2.2 times faster than the prior state-of-the-art threshold-switching-based TRNG. In addition, the TRNG endurance of bits was achieved, and the random bits passed 12 tests in the National Institute of Standards and Technology statistical test suite. Our results demonstrated that the OTS-based TRNG could provide a high–throughput and highly secure solution for edge applications.
engineering, electrical & electronic
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