New Diamond Structures Observed by Aberration-corrected TEM

Jianguo Wen,Duan Luo,Liuxiang Yang,Hongxian Xie

DOI: https://doi.org/10.1017/s1431927620020188

IF: 4.0991

2020-01-01

Microscopy and Microanalysis

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Aberration-Corrected Transmission Electron Microscopy Reveals Nanoscale Disorder in Bismuth Ferrite Single Crystals

K. Urban,C. L. Jia,L. Jin,S. B. Mi,M. Alexe,D. Hesse

DOI: https://doi.org/10.1017/s1431927614006412

IF: 4.0991

2014-01-01

Microscopy and Microanalysis

Abstract:An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Atomically Resolved 3D Shape Determination of a MgO Crystal Using a Single Aberration Corrected HRTEM Image

Chun-Lin Jia,Shao-Bo Mi,Juri Barthel,Dawei Wang,Rafal E. Dunin-Borkowski,Knut W. Urban,Andreas Thust

DOI: https://doi.org/10.1017/s1431927614006424

IF: 4.0991

2014-01-01

Microscopy and Microanalysis

Abstract:An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Resolving the Atomic Structure of Materials Containing Light Elements by Annular-Bright-Field Electron Microscopy

Lin Gu,Dongdong Xiao,Yuichi Ikuhara

DOI: https://doi.org/10.1017/s1431927615010375

IF: 4.0991

2015-01-01

Microscopy and Microanalysis

Abstract:An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Determination of Atomic Structures of Crystal Defects, Interfaces and Surfaces Via Aberration-Corrected Transmission Electron Microscopy

J Zhu,R Yu,ZY Cheng,T Ling,N Lu,L Xie,ZD Cheng,HH Zhou,XY Zhong

DOI: https://doi.org/10.1017/s1431927610059131

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Atomic Cluster Structure Identification Using Aberration-corrected Scanning Transmission Electron Microscopy

D. He,A. Logsdail,R. Johnston,R. Palmer,F. Yin,Z. Li,R. Aveyard,J. Yuan

DOI: https://doi.org/10.1017/s1431927612004527

IF: 4.0991

2012-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
CCDC 1539505: Experimental Crystal Structure Determination

Chi He,Jialei Hu,Yubing Wu,Hanfeng Ding

DOI: https://doi.org/10.5517/ccdc.csd.cc1nnzgr

2017-01-01

Abstract:Related Article: Chi He, Jialei Hu, Yubing Wu, Hanfeng Ding|2017|J.Am.Chem.Soc.|139|6098|doi:10.1021/jacs.7b02746
Aberration-Corrected High-Resolution Transmission Electron Microscopy and Its Applications in Functional Oxides

Shaobo MI,Chunlin JIA

DOI: https://doi.org/10.7502/j.issn.1674-3962.2017.07.10

2017-01-01

Abstract:In the present review paper we introduce an imaging technique based on aberration-corrected TEM,the negative CS imaging (NCSI) technique,which results in a high-contrast of image in comparison with conventional positive CS imaging (PCSI) technique.The novel NSCI technique has been applied for not only acquiring high-contrast atomic-resolution structure images of materials,but also determining the relative shifts of atomic columns with a precision of a few picometres.In addition,the NCSI technique provides experimental basis for quantitative analysis of the fine changes of atoms including light elements (e.g.oxygen) in oxide materials,e.g.the electric dipoles,domains and domain walls in oxide ferroelectrics,interfaces in heterostructural multilayer films as well as the 3D shape of a nanoscale MgO crystal.
Characterization of Nanoscale Twin Boundary Structure in Metastable Β Titanium Alloys Using Aberration-corrected Scanning Transmission Electron Microscopy

Dian Li,Yufeng Zheng

DOI: https://doi.org/10.1017/s1431927622009199

IF: 4.0991

2022-01-01

Microscopy and Microanalysis

Abstract:Journal Article Characterization of Nanoscale Twin Boundary Structure in Metastable β Titanium Alloys Using Aberration-corrected Scanning Transmission Electron Microscopy Get access Dian Li, Dian Li Department of Chemical and Materials Engineering, University of Nevada Reno, Reno, Nevada, USA Search for other works by this author on: Oxford Academic Google Scholar Yufeng Zheng Yufeng Zheng Department of Chemical and Materials Engineering, University of Nevada Reno, Reno, Nevada, USA Corresponding author: yufengz@unr.edu Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 28, Issue S1, 1 August 2022, Pages 2398–2399, https://doi.org/10.1017/S1431927622009199 Published: 01 August 2022
Quantitative Aberration-corrected Transmission Electron Microscopy

L. Houben,C. L. Jia,K. Tillmann,K. Urban

DOI: https://doi.org/10.1017/s1431927604555745

IF: 4.0991

2004-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at the Pre-Meeting Congress: Materials Research in an Aberration-Free Environment, at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, July 31 and August 1, 2004.
Development of in Situ Optical Spectroscopy with High Temporal Resolution in an Aberration-Corrected Transmission Electron Microscope.

Chang Liu,Chaojie Ma,Jinjing Xu,Ruixi Qiao,Huacong Sun,Xiaomin Li,Zhi Xu,Peng Gao,Enge Wang,Kaihui Liu,Xuedong Bai

DOI: https://doi.org/10.1063/5.0031115

IF: 1.6

2021-01-01

Review of Scientific Instruments

Abstract:Exploring the corresponding relation between structural and physical properties of materials at the atomic scale remains the fundamental problem in science. With the development of the aberration-corrected transmission electron microscopy (AC-TEM) and the ultrafast optical spectroscopy technique, sub-angstrom-scale spatial resolution and femtosecond-scale temporal resolution can be achieved, respectively. However, the attempt to combine both their advantages is still a great challenge. Here, we develop in situ optical spectroscopy with high temporal resolution in AC-TEM by utilizing a self-designed and manufactured TEM specimen holder, which has the capacity of sub-angstrom-scale spatial resolution and femtosecond-scale temporal resolution. The key and unique design of our apparatus is the use of the fiber bundle, which enables the delivery of focused pulse beams into TEM and collection of optical response simultaneously. The generated focused spot has a size less than 2 µm and can be scanned in plane with an area larger than 75 × 75 µm2. Most importantly, the positive group-velocity dispersion caused by glass fiber is compensated by a pair of diffraction gratings, thus resulting in the generation of pulse beams with a pulse width of about 300 fs (@ 3 mW) in TEM. The in situ experiment, observing the atomic structure of CdSe/ZnS quantum dots in AC-TEM and obtaining the photoluminescence lifetime (∼4.3 ns) in the meantime, has been realized. Further ultrafast optical spectroscopy with femtosecond-scale temporal resolution could be performed in TEM by utilizing this apparatus.
Aberration corrected STEM and EELS: Atomic scale chemical mapping

A. L. Bleloch,M. Gass,L. Jiang,B. Mendis,K. Sader,P. Wang

DOI: https://doi.org/10.1007/978-3-540-85156-1_1

2008-01-01

Imaging & Microscopy

Abstract:Scanning transmission electron microscopy (STEM) has enjoyed a recent surge in activity for two reasons. A long awaited improvement in the STEM performance of conventional TEM/STEM instruments coincided with the advent of aberration correction. This improvement was not for any fundamental reason — from the principle of reciprocity, the STEM resolution should be at least as good as the TEM resolution for the same objective lens. Lattice resolution high angle annular dark field (HAADF) STEM images are now a much more routine part of the analytical arsenal applied to materials characterisation.
Applications of Aberration-corrected TEM and STEM in Complex Oxides and Nanostructured Materials

S Lazar,L-Y Chang,L Gunawan,Y Shao,GA Botton

DOI: https://doi.org/10.1017/S1431927609098663

IF: 4.0991

2009-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Interface Structure-Property Relations Through Aberration-Corrected STEM

SJ Pennycook,AY Borisevich,M Varela,AR Lupini,HJ Chang,DN Leonard,TJ Pennycook,MP Oxley,JC Idrobo,H Yurdakul,S Turan,P Yu,R Ramesh,ST Pantelides

DOI: https://doi.org/10.1017/s1431927610059787

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Atomic studies on ferroelectric oxides by aberration corrected transmission electron microscopy

K. Urban,C. L. Jia

DOI: https://doi.org/10.1007/978-3-540-85226-1_2

2008-01-01

Abstract:The advent of aberration-corrected transmission electron microscopy in 1998 [1] has provided materials science with entirely new tools for quantitative investigations. Four key innovations have to be mentioned: (1) The possibility to operate the electron microscope as a variable-sphericalaberration instrument allows to derive a new phase contrast theory optimizing both resolution and point spread [2]. In classical Scherzer phase contrast theory the radius of the point spread disc amounts to three times the Scherzer resolution limit. Besides the fact that information is lost by placing an aperture in the diffraction plane to keep the contrast oscillations in the contrast transfer function from affecting the images this point spread is a second disadvantage of the classical Scherzer approach to phase contrast. Both limitations can be substantially reduced in a new theory in which by both the objective lens defocus Z as well as C S the spherical aberration parameter adopt specific values. As a result the resolution limit coincides with the information limit and the point spread gets reduced to about one half of the latter making it an uncritical parameter in practice. (2) The negative spherical aberration imaging (NCSI) technique leads to enhanced contrast of atoms with low nuclear charge number [3]. It relies on two advantages compared to the classical Zernike technique. The shift of the phase of the diffracted waves is, in contrast to the classical Scherzer technique, in clockwise direction leading to white atom contrast. Furthermore the contrast is enhanced by a dynamic non-linear effect. Oxygen, nitrogen and even boron can be imaged directly even when these atomic species occur in close distance to heavy cations. (3) Essentially point-spread-free atomic images allow to measure occupancies of atomic columns, i.e. local concentrations, with lateral atomic resolution evaluating atomically resolved intensity measurements [4]. This means that high-resolution is not only a structural technique. From now on also local composition maps can be derived which are forming an excellent starting point for ab-initio calculations of interface-, boundary- and defect structures. (4) Measurements of atomic distances can be carried out at an accuracy of a few picometers
New Metastable Carbon Phases Observed by HRTEM

Duan Luo,Liuxiang Yang,Hongxian Xie,Ho-kwang Mao,Jianguo Wen

DOI: https://doi.org/10.1017/s1431927619009371

IF: 4.0991

2019-01-01

Microscopy and Microanalysis

Abstract:Journal Article New metastable carbon phases observed by HRTEM Get access Duan Luo, Duan Luo Center for Nanoscale Materials, Argonne National Laboratory, Argonne, IL 60439Key Laboratory of Ultra-fast Photoelectric Diagnostics Technology, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an 710119, ChinaUniversity of Chinese Academy of Sciences, Beijing 100049, China dluo@anl.gov Search for other works by this author on: Oxford Academic Google Scholar Liuxiang Yang, Liuxiang Yang Center for High Pressure Science and Technology Advanced Research, Beijing, 100094, ChinaGeophysical Laboratory, Carnegie Institution of Washington, Washington, DC, 20015, USA Search for other works by this author on: Oxford Academic Google Scholar Hongxian Xie, Hongxian Xie Hebei University of Technology, Tianjin 300132, China Search for other works by this author on: Oxford Academic Google Scholar Ho-kwang Mao, Ho-kwang Mao Center for High Pressure Science and Technology Advanced Research, Beijing, 100094, ChinaGeophysical Laboratory, Carnegie Institution of Washington, Washington, DC, 20015, USA Search for other works by this author on: Oxford Academic Google Scholar Jianguo Wen Jianguo Wen Center for Nanoscale Materials, Argonne National Laboratory, Argonne, IL 60439 Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 25, Issue S2, 1 August 2019, Pages 1728–1729, https://doi.org/10.1017/S1431927619009371 Published: 01 August 2019
Measuring Atoms in Oxide Heterostructures by Quantitative Aberration-Corrected Transmission Electron Microscopy

K.W. Urban,C.-L. Jia

DOI: https://doi.org/10.1017/s1431927613004911

IF: 4.0991

2013-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Probing Asymmetric Interfaces of LaMnO3 / SrMnO3 Superlattices with Aberration-Corrected Scanning Transmission Electron Microscopy

AB Shah,SJ May,JG Wen,X Zhai,JN Eckstein,A Bhattacharya,JM Zuo

DOI: https://doi.org/10.1017/s1431927608083529

IF: 4.0991

2008-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008
Negative Spherical Aberration Ultrahigh-Resolution Imaging in Corrected Transmission Electron Microscopy

K. Urban,Chun‐Lin Jia,Lothar Houben,M. Lentzen,Shao‐Bo Mi,Karsten Tillmann

DOI: https://doi.org/10.1098/rsta.2009.0134

2009-01-01

Abstract:Aberration-corrected transmission electron microscopy allows us to image the structure of matter at genuine atomic resolution. A prominent role for the imaging of crystalline samples is played by the negative spherical aberration imaging (NCSI) technique. The physical background of this technique is reviewed. The especially high contrast observed under these conditions owes its origin to an enhancing combination of amplitude contrast due to electron diffraction channelling and phase contrast. A number of examples of the application of NCSI are reviewed in order to illustrate the applicability and the state-of-the-art of this technique.
High-resolution transmission electron microscopy using negative spherical aberration.

Chun-Lin Jia,Markus Lentzen,Knut Urban

DOI: https://doi.org/10.1017/S1431927604040425

IF: 4.0991

2004-01-01

Microscopy and Microanalysis

Abstract:A novel imaging mode for high-resolution transmission electron microscopy is described. It is based on the adjustment of a negative value of the spherical aberration C-S of the objective lens of a transmission electron microscope equipped with a multipole aberration corrector system. Negative spherical aberration applied together with an overfocus yields high-resolution images with bright-atom contrast. Compared to all kinds of images taken in conventional transmission electron microscopes, where the then unavoidable positive spherical aberration is combined with an underfocus, the contrast is dramatically increased. This effect can only be understood on the basis of a full nonlinear imaging theory. Calculations show that the nonlinear contrast contributions diminish the image contrast relative to the linear image for a positive-C-S setting whereas they reinforce the image contrast relative to the linear image for a negative-C-S setting. The application of the new mode to the imaging of oxygen in SrTiO3 and YBa2Cu3O7 demonstrates the benefit to materials science investigations. It allows us to image directly, without further image processing, strongly scattering heavy-atom columns together with weakly scattering light-atom columns.
Probing Nanoscale Structural Heterogeneity in Metallic Glasses Using 4-D STEM

Soohyun Im,Zhen Chen,Jared M. Johnson,Pengyang Zhao,Geun Hee Yoo,Eun Soo Park,Yunzhi Wang,David A. Muller,Jinwoo Hwang

DOI: https://doi.org/10.1017/s1431927618001502

IF: 4.0991

2018-01-01

Microscopy and Microanalysis

Abstract:An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

New Diamond Structures Observed by Aberration-corrected TEM

Aberration-Corrected Transmission Electron Microscopy Reveals Nanoscale Disorder in Bismuth Ferrite Single Crystals

Atomically Resolved 3D Shape Determination of a MgO Crystal Using a Single Aberration Corrected HRTEM Image

Resolving the Atomic Structure of Materials Containing Light Elements by Annular-Bright-Field Electron Microscopy

Determination of Atomic Structures of Crystal Defects, Interfaces and Surfaces Via Aberration-Corrected Transmission Electron Microscopy

Atomic Cluster Structure Identification Using Aberration-corrected Scanning Transmission Electron Microscopy

CCDC 1539505: Experimental Crystal Structure Determination

Aberration-Corrected High-Resolution Transmission Electron Microscopy and Its Applications in Functional Oxides

Characterization of Nanoscale Twin Boundary Structure in Metastable Β Titanium Alloys Using Aberration-corrected Scanning Transmission Electron Microscopy

Quantitative Aberration-corrected Transmission Electron Microscopy

Development of in Situ Optical Spectroscopy with High Temporal Resolution in an Aberration-Corrected Transmission Electron Microscope.

Aberration corrected STEM and EELS: Atomic scale chemical mapping

Applications of Aberration-corrected TEM and STEM in Complex Oxides and Nanostructured Materials

Interface Structure-Property Relations Through Aberration-Corrected STEM

Atomic studies on ferroelectric oxides by aberration corrected transmission electron microscopy

New Metastable Carbon Phases Observed by HRTEM

Measuring Atoms in Oxide Heterostructures by Quantitative Aberration-Corrected Transmission Electron Microscopy

Probing Asymmetric Interfaces of LaMnO3 / SrMnO3 Superlattices with Aberration-Corrected Scanning Transmission Electron Microscopy

Negative Spherical Aberration Ultrahigh-Resolution Imaging in Corrected Transmission Electron Microscopy

High-resolution transmission electron microscopy using negative spherical aberration.

Probing Nanoscale Structural Heterogeneity in Metallic Glasses Using 4-D STEM