Achieving High Resolution Measurement Using Laser Diode Operating at Period One

Yuxi Ruan,Bairun Nie,Yanguang Yu,Jiangtao Xi,Qinghua Guo,Jun Tong,Zhuqiu Chen
DOI: https://doi.org/10.1117/12.2542592
2019-01-01
Abstract:When a part of light emitted by a laser is back-reflected or back-scattered from an external target and re-enters the laser cavity, both the laser intensity and its wavelength can be modulated. This is so-called self-mixing effect (SME), the optical feedback interferometry (OFI) utilizes such effect in an LD developed various applications. In this paper, we use a dualcavity OFI system that operating in period one state, the laser intensity from this system exhibits an oscillation with its amplitude modulated by a traditional single cavity OFI signal. The dual-cavity OFI system has the same measurement resolution as the single cavity which is half laser wavelength. This paper developed a method to improve the resolution by using fringe subdivision. Our simulation result shows that this method can achieve subnanometer resolution.
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