Study of the Interface Interaction Mechanism Between 9,10-Bis(4-(1,2,2-triphenylvinyl) Styryl)anthracene Film and Si Substrate

Shunyu Jin,Fei Liu,Shaozhi Deng,Xiang Zhou,Jun Chen,Ningsheng Xu
DOI: https://doi.org/10.1166/sam.2015.2389
2015-01-01
Science of Advanced Materials
Abstract:9,10-bis(4-(1,2,2-triphenylvinyl)styryl)anthracene (TPE-An) material has been paid much attention because of its unique piezofluorochromic characters. Interface properties of TPE-An film on Si (001) substrate were firstly investigated by scanning tunneling microscopy (STM) technique. It shows that both highest occupied molecular orbital (HOMO) and lowest unoccupied molecular orbital (LUMO) of TPE-An film exhibit the same bending tendency towards the Fermi level with the increase of the applied electric field, which causes the HOMO LUMO gap shrinking effect. A maximum gap-shrinking can reach 1.21 eV in scanning tunneling spectroscopy (STS) experiments, which results from the shift of HOMO (0.34 eV) and LUMO (0.87 eV) bands. It is also found that the capacitive interface between TPE-An film and substrate determines their physical behaviors. Furthermore, both the polarization effect and sub-surface electric field were proposed to be responsible for different bending behaviors of the HOMO and LUMO at applied field. Our research method may shed new light on comprehending the interaction mechanism between aggregation-induced emission (AIE) materials and substrate.
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