Abstract:A new facility for microdiffraction strain measurements and microfluorescence mapping has been built on beamline 12.3.2 at the advanced light source of the Lawrence Berkeley National Laboratory. This beamline benefits from the hard x-radiation generated by a 6 T superconducting bending magnet (superbend). This provides a hard x-ray spectrum from 5 to 22 keV and a flux within a 1 microm spot of approximately 5x10(9) photons/s (0.1% bandwidth at 8 keV). The radiation is relayed from the superbend source to a focus in the experimental hutch by a toroidal mirror. The focus spot is tailored by two pairs of adjustable slits, which serve as secondary source point. Inside the lead hutch, a pair of Kirkpatrick-Baez (KB) mirrors placed in a vacuum tank refocuses the secondary slit source onto the sample position. A new KB-bending mechanism with active temperature stabilization allows for more reproducible and stable mirror bending and thus mirror focusing. Focus spots around 1 microm are routinely achieved and allow a variety of experiments, which have in common the need of spatial resolution. The effective spatial resolution (approximately 0.2 microm) is limited by a convolution of beam size, scan-stage resolution, and stage stability. A four-bounce monochromator consisting of two channel-cut Si(111) crystals placed between the secondary source and KB-mirrors allows for easy changes between white-beam and monochromatic experiments while maintaining a fixed beam position. High resolution stage scans are performed while recording a fluorescence emission signal or an x-ray diffraction signal coming from either a monochromatic or a white focused beam. The former allows for elemental mapping, whereas the latter is used to produce two-dimensional maps of crystal-phases, -orientation, -texture, and -strain/stress. Typically achieved strain resolution is in the order of 5x10(-5) strain units. Accurate sample positioning in the x-ray focus spot is achieved with a commercial laser-triangulation unit. A Si-drift detector serves as a high-energy-resolution (approximately 150 eV full width at half maximum) fluorescence detector. Fluorescence scans can be collected in continuous scan mode with up to 300 pixels/s scan speed. A charge coupled device area detector is utilized as diffraction detector. Diffraction can be performed in reflecting or transmitting geometry. Diffraction data are processed using XMAS, an in-house written software package for Laue and monochromatic microdiffraction analysis.

Early Science Commissioning Results Of The Sub-Micron Resolution X-Ray Spectroscopy Beamline (Srx) In The Field Of Materials Science And Engineering

X-ray microscopy instrumentation developments at NSLS-II: recent progress and future directions

Beam instrumentation system development and commissioning in ssrf

Beam instrumentation system for shanghai soft x-ray fel test facility*

Applications for Synchrotron Radiation in Inertial Confinement Fusion Research

A new experimental station for microbeam X‐ray scattering at the SSRF BL10U1 beamline

A Dedicated Superbend X-Ray Microdiffraction Beamline for Materials, Geo-, and Environmental Sciences at the Advanced Light Source

Design and Commission of A Superconducting Wiggler X-Ray Beamline for Advanced Materials Investigation at the National Synchrotron Radiation Research Center

VerSoX B07‐B: a high‐throughput XPS and ambient pressure NEXAFS beamline at Diamond Light Source

A 30 Nm-Resolution Hard X-ray Microscope with X-ray Fluorescence Mapping Capability at BSRF.

Commissioning and Operation of the Beamline for Photoelectron Spectroscopy in NSRL

The Xafs Beamline of Ssrf

High-resolution soft X-ray emission spectrograph at advanced light source

Introduction to the Workshop and Presentation of IUCr SR and XAFS Commissions Strategies toward Standardization

Beamline Spectroscopy of Integrated Circuits With Hard X-ray Transition Edge Sensors at the Advanced Photon Source

High Resolution Hard X-Ray Microscope On A Second Generation Synchrotron Source

High-performance soft x-ray spectromicroscopy beamline at SSRF.

Commissioning of a new beamline and station for ARPES at NSRL

X-Ray Beamlines at the Superconducting Wiggler of Nsrl

Design of an Ultrahigh-Energy-Resolution and Wide-Energy-Range Soft X-Ray Beamline

Soft X-ray microscopy using the synchrotron radiation from the NSRL at Hefei