Abstract:Far-field super-resolution imaging techniques such as stimulated emission depletion (STED), stochastic optical reconstruction microscopy (STORM), and photoactivation localization microscopy (PALM) etc., have enabled fluorescence labeled nanoscale imaging and analysis. However, it is necessary or preferable to develop label-free high resolution imaging techniques to avoid the problems of phototoxicity with live cells and moreover, for many non-biological applications where fluorescent labelling is simply not feasible. Recently, by capturing the exponentially decaying evanescent waves and propagating it to far field, novel imaging technique like hyperlens and microsphere contacting technologies, micro-fiber and nanowire illumination technology have brought new opportunities to label-free super resolution imaging, but still suffer from weak signal compared to background noise. On the other hand, there is lack of criteria reported to quantify the imaging quality of label free far-field nanoscopy, that will slow down the developing of label-free far-field nanoscopy. We introduce CNR first to label-free far-field nanoscopy to quantify the imaging performance and investigate the key influencing elements systematically. In our study, we investigated and analyzed the key elements to achieve high CNR label-free wide-field far-field sub-diffraction imaging. By optimizing the key factors including polarization, materials, as well as fabrication conditions, sub-diffraction imaging with resolution of 122 nm in a large FOV has been achieved experimentally. This work has provided an efficient and convenient way to realize high contrast wide-field far-field label-free super-resolution based on evanescent wave illumination.

Reversible Contrast in Focus Series of Annular Bright Field Images for thin specimen

High-contrast Wide-Field Evanescent Wave Illuminated Subdiffraction Imaging.

Contrast Reversal Confocal Microscopy

Reversible contrast in focus series of annular bright field images of a crystalline LiMn₂O₄ nanowire.

A Method for Achieving Multiple Foci with Subdiffraction Resolution along the Axial Direction

Nonlinear Focal Modulation Microscopy Based on Interleaved Reconstruction

High Contrast Wide-Field Evanescent Wave Illuminated Sub-Diffraction Imaging (conference Presentation)

Annular Oblique Epi-Illumination Design for Ultra-Large-scale and High-Resolution Fluorescence Microscopy

Annular pupil focal modulation microscopy

On central focusing for contrast optimization in direct electron ptychography of thick samples

In-Line Phase Contrast Imaging Using A Micro-Focus X-Ray Source

Better Contrast for Imaging Defects by ABF

Contrast in Atomically Resolved EF-SCEM Imaging

Amplitude Contrast Imaging in High-Resolution Transmission Electron Microscopy of Ferroelectric Superlattice Film

Contrast and Axial Confinement Enhancement in Deep Imaging Via HiLo-based Line-Scanning Temporal Focusing Microscopy

Single-Exposure Optical Focusing Inside Scattering Media Using Binarized Time-Reversed Adapted Perturbation

Bright-field imaging of compound semiconductors using aberration-corrected scanning transmission electron microscopy

B11-O-12Development of Hollow Cone Dark Field Environmental Electron Microscopy and Their Biological Application

Optimizing Focus: Switchable Modes and Sub-Diffraction Spots in Inverse Circular Airy Beams

Establishment of Annular Dark-Field Scanning Confocal Electron Microscopy using a Double Aberration-Corrected Microscope

An apparatus for qualitative assessment the shading ratio of oblique illumination and real‐time high‐contrast imaging