Better Contrast for Imaging Defects by ABF

Peng Gao,Ryo Ishikawa,Bin Feng,Naoya Shibata,Yuichi Ikuhara
DOI: https://doi.org/10.1017/s1431927617003087
IF: 4.0991
2017-01-01
Microscopy and Microanalysis
Abstract:Electron microscopy laboratory, School of Physics, and Center for Nanochemistry, Peking University, Beijing 100871, China Collaborative Innovation Center of Quantum Matter, Beijing 100871, China Center for Nanochemistry, Peking University, Beijing 100871, China Institute of Engineering Innovation, The University of Tokyo, Tokyo 113–8656, Japan Nanostructures Research Laboratory, Japan Fine Ceramic Center, Nagoya 456-8587, Japan WPI Advanced Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan
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