Abstract:Fourier ptychography microscopy (FPM) shares its roots with the synthetic aperture technique and phase retrieval method, and is a recently developed computational microscopic super-resolution technique. By turning on the light-emitting diode (LED) elements sequentially and acquiring the corresponding images that contain different spatial frequencies, FPM can achieve a wide field-of-view (FOV), high-spatial-resolution imaging and phase recovery simultaneously. Conventional FPM assumes that the sample is sufficiently thin and strictly in focus. Nevertheless, even for a relatively thin sample, the non-planar distribution characteristics and the non-ideal position/posture of the sample will cause all or part of FOV to be defocused. In this paper, we proposed a fast digital refocusing and depth-of-field (DOF) extended FPM strategy by taking the advantages of image lateral shift caused by sample defocusing and varied-angle illuminations. The lateral shift amount is proportional to the defocus distance and the tangent of the illumination angle. Instead of searching the optimal defocus distance with the optimization search strategy, which is time consuming, the defocus distance of each subregion of the sample can be precisely and quickly obtained by calculating the relative lateral shift amounts corresponding to different oblique illuminations. And then, digital refocusing strategy rooting in the angular spectrum (AS) method is integrated into FPM framework to achieve the high-resolution and phase information reconstruction for each part of the sample, which means the DOF of the FPM can be effectively extended. The feasibility of the proposed method in fast digital refocusing and DOF extending is verified in the actual experiments with the USAF chart and biological samples.

On central focusing for contrast optimization in direct electron ptychography of thick samples

Contrast Reversal Confocal Microscopy

Phase offset method of ptychographic contrast reversal correction

Effect of spatial spectrum overlap on fourier ptychographic microscopy

Reliable phase quantification in focused probe electron ptychography of thin materials

Robust Ptychographic Reconstruction with an Out-of-Focus Electron Probe

Inner-Focusing Reconstruction Method for Grating-Based Phase-Contrast Ct

Improved Three-Dimensional Reconstructions in Electron Ptychography through Defocus Series Measurements

Fast Digital Refocusing and Depth of Field Extended Fourier Ptychography Microscopy

High-quality imaging of large areas through path-difference ptychography

DeepFocus: fast focus and astigmatism correction for electron microscopy

Single-Exposure Optical Focusing Inside Scattering Media Using Binarized Time-Reversed Adapted Perturbation

Multi-Convergence-Angle Ptychography with Simultaneous Strong Contrast and High Resolution

At-focus scanning ptychography for high resolution imaging with a wide field of view

Differential phase contrast for quantitative imaging and spectro-microscopy at a nanoprobe beamline

Inner Focus Iterative Reconstruction Method with the Interlaced Phase Stepping Scanning for Grating-based Phase Contrast Tomography

Exact inversion of partially coherent dynamical electron scattering for picometric structure retrieval

Large step size fly-scan ptychography using local sample separation reconstruction

Edge Enhanced X-Ray Phase Tomography