Probing angle-resolved reflection signatures of intralayer and interlayer excitons in monolayer and bilayer MoS2
Hanwei Hu,Xuewen Zhang,Xinyu Zhang,Lishu Wu,Vanessa Li Zhang,Silin He,Guangchao Shi,Ting Yu,Jingzhi Shang
DOI: https://doi.org/10.1007/s12274-022-5292-4
IF: 9.9
2022-12-24
Nano Research
Abstract:Strongly bound excitons in atomically thin transition metal dichalcogenides offer many opportunities to reveal the underlying physics of basic quasiparticles and many-body effects in the two-dimensional (2D) limit. Comprehensive reflection investigation on band-edge exciton transitions is essential to exploring wealthy light-matter interactions in the emerging 2D semiconductors, whereas angle-resolved reflection (ARR) characteristics of intralayer and interlayer excitons in 2D MoS 2 layers remain unclear. Herein, we report ARR spectroscopic features of A, B, and interlayer excitons in monolayer (ML) and bilayer (BL) MoS 2 on three kinds of photonic substrates, involving distinct exciton-photon interactions. In a BL MoS 2 on a protected silver mirror, the interlayer exciton with one-third amplitude of A exciton appears at 0.05 eV above the A exciton energy, exhibiting an angle-insensitive energy dispersion. When ML and BL MoS 2 lie on a SiO 2 -covered silicon, the broad trapped-photon mode weakly couples with the reflection bands of A and B excitons by the Fano resonance effect, causing the asymmetric lineshapes and the redshifted energies. After transferring MoS 2 layers onto a one-dimensional photonic crystal, two high-lying branches of B-exciton polaritons are formed by the interactions between B excitons and Bragg photons, beyond the weak-coupling regime. This work provides ARR spectral benchmarks of A, B, and interlayer excitons in ML and BL MoS 2 , gaining insights into the interpretation of light-matter interactions in 2D semiconductors and the design of their devices for practical photonic applications.
materials science, multidisciplinary,chemistry, physical,physics, applied,nanoscience & nanotechnology