Abstract:The crystallographic texture is a key organization feature of many technical and biological materials. In these materials, especially hierarchically structured ones, the preferential alignment of the nano constituents is heavily influencing the macroscopic behaviour of the material. In order to study local crystallographic texture with both high spatial and angular resolution, we developed Texture tomography (TexTOM). This approach allows to model the diffraction data of polycrystalline materials by using the full reciprocal space of the ensemble of crystals and describe the texture in each voxel via a orientation distribution function. This means, it provides 3D reconstructions of the local texture by measuring the probabilities of all crystal orientations. The TexTOM approach addresses limitations associated with existing models: It correlates the intensities from several Bragg reflections, thus reduces ambiguities resulting from symmetry. Further, it yields quantitative probability distributions of local real space crystal orientations without further assumptions on the sample structure. Finally, its efficient mathematical formulation enables reconstructions faster than the time-scale of the experiment. In this manuscript, we present the mathematical model, the inversion strategy and its current experimental implementation. We show characterizations of simulated data as well as experimental data obtained from a synthetic, inorganic model sample, the silica-witherite biomorph. In conclusion, Tex-TOM provides a versatile framework to reconstruct 3D quantitative texture information for polycrystalline samples. In this way, it opens the door for unprecedented insights into the nanostructural makeup of natural and technical materials.

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